Control focused soft error detection for embedded applications

Karthik Shankar; Roman Lysecky

doi:10.1109/LES.2010.2091940

Control focused soft error detection for embedded applications

Karthik Shankar, Roman Lysecky

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

Advances in integrated circuits present several key challenges in system reliability as soft errors are expected to increase with successive technology generations. Computing systems must be able to continue functioning in spite of these soft errors, necessitating the development of new methods for self-healing circuits that can detect and recover from these errors. We present an area-efficient control focused soft error detector (CNFSED) capable of nonintrusively detecting soft errors within the execution of a software application without modifications to the software application or the target processor. This soft error detector achieves an error detection rate greater than 90% for control errors and 85% of unmasked errors while incurring minimal area overhead.

Original language	English (US)
Article number	5629436
Pages (from-to)	127-130
Number of pages	4
Journal	IEEE Embedded Systems Letters
Volume	2
Issue number	4
DOIs	https://doi.org/10.1109/LES.2010.2091940
State	Published - Dec 2010

Keywords

Dynamic profiling
multicore systems
multitasking
real-time embedded systems
soft error detection

ASJC Scopus subject areas

Control and Systems Engineering
General Computer Science

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10.1109/LES.2010.2091940

Cite this

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title = "Control focused soft error detection for embedded applications",

abstract = "Advances in integrated circuits present several key challenges in system reliability as soft errors are expected to increase with successive technology generations. Computing systems must be able to continue functioning in spite of these soft errors, necessitating the development of new methods for self-healing circuits that can detect and recover from these errors. We present an area-efficient control focused soft error detector (CNFSED) capable of nonintrusively detecting soft errors within the execution of a software application without modifications to the software application or the target processor. This soft error detector achieves an error detection rate greater than 90% for control errors and 85% of unmasked errors while incurring minimal area overhead.",

keywords = "Dynamic profiling, multicore systems, multitasking, real-time embedded systems, soft error detection",

author = "Karthik Shankar and Roman Lysecky",

note = "Funding Information: Manuscript received June 04, 2010; revised October 14, 2010; accepted November 08, 2010. Date of publication November 11, 2010; date of current version December 17, 2010. This work was supported in part by the National Science Foundation under Award CNS-0844565. This manuscript was recommended for publication by R. Kumar.",

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language = "English (US)",

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AU - Shankar, Karthik

AU - Lysecky, Roman

N1 - Funding Information: Manuscript received June 04, 2010; revised October 14, 2010; accepted November 08, 2010. Date of publication November 11, 2010; date of current version December 17, 2010. This work was supported in part by the National Science Foundation under Award CNS-0844565. This manuscript was recommended for publication by R. Kumar.

PY - 2010/12

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N2 - Advances in integrated circuits present several key challenges in system reliability as soft errors are expected to increase with successive technology generations. Computing systems must be able to continue functioning in spite of these soft errors, necessitating the development of new methods for self-healing circuits that can detect and recover from these errors. We present an area-efficient control focused soft error detector (CNFSED) capable of nonintrusively detecting soft errors within the execution of a software application without modifications to the software application or the target processor. This soft error detector achieves an error detection rate greater than 90% for control errors and 85% of unmasked errors while incurring minimal area overhead.

AB - Advances in integrated circuits present several key challenges in system reliability as soft errors are expected to increase with successive technology generations. Computing systems must be able to continue functioning in spite of these soft errors, necessitating the development of new methods for self-healing circuits that can detect and recover from these errors. We present an area-efficient control focused soft error detector (CNFSED) capable of nonintrusively detecting soft errors within the execution of a software application without modifications to the software application or the target processor. This soft error detector achieves an error detection rate greater than 90% for control errors and 85% of unmasked errors while incurring minimal area overhead.

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KW - multitasking

KW - real-time embedded systems

KW - soft error detection

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Control focused soft error detection for embedded applications

Abstract

Keywords

ASJC Scopus subject areas

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