Contrast sensitivity and dynamic range measurements of CdZnTe semiconductors for direct type flat-panel imaging

G. C. Giakos, R. Guntupalli, N. Shah, S. Vedantham, S. Suryanarayanan, S. Chowdhury, A. G. Passerini, K. Mehta, S. Sumrain, N. Patnekar, E. A. Evans, R. Endorf, Fabrizio Russo

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Physics