Contrast sensitivity and dynamic range measurements of CdZnTe semiconductors for direct type flat-panel imaging

G. C. Giakos; R. Guntupalli; N. Shah; S. Vedantham; S. Suryanarayanan; S. Chowdhury; A. G. Passerini; K. Mehta; S. Sumrain; N. Patnekar; E. A. Evans; R. Endorf; Fabrizio Russo

Contrast sensitivity and dynamic range measurements of CdZnTe semiconductors for direct type flat-panel imaging

G. C. Giakos
, R. Guntupalli
, N. Shah
, S. Vedantham
, S. Suryanarayanan
, S. Chowdhury
, A. G. Passerini
, K. Mehta
, S. Sumrain
, N. Patnekar
, E. A. Evans
, R. Endorf
, Fabrizio Russo

Research output: Contribution to conference › Paper › peer-review

Abstract

The contrast sensitivity and dynamic range of Cd_1-xZn_xTe semiconductor detectors have been measured, within the x-ray diagnostic energy range, using a contrast sensitivity phantom. The aim of this study is to optimize the image quality parameters of these solid state-ionization devices for flat panel digital radiographic applications. The experimental results of this study indicate that Cd_1-xZn_xTe detectors have excellent contrast sensitivity response and large dynamic range.

Original language	English (US)
Pages	375-379
Number of pages	5
State	Published - 2000
Externally published	Yes
Event	IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control' - Baltimore, MD, USA Duration: May 1 2000 → May 4 2000

Conference

Conference	IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control'
City	Baltimore, MD, USA
Period	5/1/00 → 5/4/00

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

Giakos, G. C., Guntupalli, R., Shah, N., Vedantham, S., Suryanarayanan, S., Chowdhury, S., Passerini, A. G., Mehta, K., Sumrain, S., Patnekar, N., Evans, E. A., Endorf, R., & Russo, F. (2000). Contrast sensitivity and dynamic range measurements of CdZnTe semiconductors for direct type flat-panel imaging. 375-379. Paper presented at IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control', Baltimore, MD, USA.

Contrast sensitivity and dynamic range measurements of CdZnTe semiconductors for direct type flat-panel imaging. / Giakos, G. C.; Guntupalli, R.; Shah, N. et al.
2000. 375-379 Paper presented at IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control', Baltimore, MD, USA.

Research output: Contribution to conference › Paper › peer-review

Giakos, GC, Guntupalli, R, Shah, N, Vedantham, S, Suryanarayanan, S, Chowdhury, S, Passerini, AG, Mehta, K, Sumrain, S, Patnekar, N, Evans, EA, Endorf, R & Russo, F 2000, 'Contrast sensitivity and dynamic range measurements of CdZnTe semiconductors for direct type flat-panel imaging', Paper presented at IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control', Baltimore, MD, USA, 5/1/00 - 5/4/00 pp. 375-379.

Giakos GC, Guntupalli R, Shah N, Vedantham S, Suryanarayanan S, Chowdhury S et al.. Contrast sensitivity and dynamic range measurements of CdZnTe semiconductors for direct type flat-panel imaging. 2000. Paper presented at IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control', Baltimore, MD, USA.

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abstract = "The contrast sensitivity and dynamic range of Cd1-xZnxTe semiconductor detectors have been measured, within the x-ray diagnostic energy range, using a contrast sensitivity phantom. The aim of this study is to optimize the image quality parameters of these solid state-ionization devices for flat panel digital radiographic applications. The experimental results of this study indicate that Cd1-xZnxTe detectors have excellent contrast sensitivity response and large dynamic range.",

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language = "English (US)",

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T1 - Contrast sensitivity and dynamic range measurements of CdZnTe semiconductors for direct type flat-panel imaging

AU - Giakos, G. C.

AU - Guntupalli, R.

AU - Shah, N.

AU - Vedantham, S.

AU - Suryanarayanan, S.

AU - Chowdhury, S.

AU - Passerini, A. G.

AU - Mehta, K.

AU - Sumrain, S.

AU - Patnekar, N.

AU - Evans, E. A.

AU - Endorf, R.

AU - Russo, Fabrizio

PY - 2000

Y1 - 2000

N2 - The contrast sensitivity and dynamic range of Cd1-xZnxTe semiconductor detectors have been measured, within the x-ray diagnostic energy range, using a contrast sensitivity phantom. The aim of this study is to optimize the image quality parameters of these solid state-ionization devices for flat panel digital radiographic applications. The experimental results of this study indicate that Cd1-xZnxTe detectors have excellent contrast sensitivity response and large dynamic range.

AB - The contrast sensitivity and dynamic range of Cd1-xZnxTe semiconductor detectors have been measured, within the x-ray diagnostic energy range, using a contrast sensitivity phantom. The aim of this study is to optimize the image quality parameters of these solid state-ionization devices for flat panel digital radiographic applications. The experimental results of this study indicate that Cd1-xZnxTe detectors have excellent contrast sensitivity response and large dynamic range.

UR - https://www.scopus.com/pages/publications/0033706052

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M3 - Paper

AN - SCOPUS:0033706052

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T2 - IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control'

Y2 - 1 May 2000 through 4 May 2000

ER -

Contrast sensitivity and dynamic range measurements of CdZnTe semiconductors for direct type flat-panel imaging

Abstract

Conference

ASJC Scopus subject areas

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