Consideration and control of writing conditions with a near-field APSIL probe

Shu Guo Tang, Thomas D Milster, D. O'Connell, M. Bailey

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The Solid Immersion Lenses (SIL) and aperture probes are two near field optical techniques that are capable of generating smaller spot size than that of far-field optical systems. Neither technique can generate both ultra-small spot size and exhibit high optical efficiency. Small spot size produces higher contrast signals, which leads to an increase in signal-to-noise ratio (SNR) and an enlargement in the capacity of an optical disk. Higher optical efficiency gives higher throughput in the optical system, which accelerates data rate. The technique of near-field Aperture SIL (APSIL), which combines a dielectric aperture probe and a SIL, is a promising method to achieve both small spot size and high optical efficiency. The objective of this paper is to explore the writing conditions for implementing APSIL to reduce mark size to a fraction of that from the far-field data storage systems. In this paper, we investigate the effect of polarization of the light on the spot profile and the optimal axial focus position by experiments and simulations.

Original languageEnglish (US)
Title of host publication2002 International Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002, Technical Digest
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages243-245
Number of pages3
ISBN (Electronic)0780373790, 9780780373792
DOIs
StatePublished - 2002
EventInternational Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002 - Waikoloa, United States
Duration: Jul 7 2002Jul 11 2002

Publication series

Name2002 International Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002, Technical Digest

Other

OtherInternational Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002
Country/TerritoryUnited States
CityWaikoloa
Period7/7/027/11/02

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electronic, Optical and Magnetic Materials

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