TY - GEN
T1 - Computerized repairable inventory management with reliability growth and system installations increase
AU - Jin, Tongdan
AU - Liao, Haitao
AU - Xiong, Zhenhua
AU - Sung, Chen Han
PY - 2006
Y1 - 2006
N2 - Impact of reliability growth on repairable inventory with the application to semiconductor test equipment is discussed and analyzed in this paper. Semiconductor test equipment is capital-intensive product built with swappable and repairable modules (i.e. printed-circuit-boards) to facilitate the maintenance and repair of the system. A stochastic inventory model is proposed to estimate the demand rate for defective modules considering the reliability growth and the increase of field system installations. Three test statistics, the Laplace test, the nonparametric test and the Crow/AMSAA, are used to examine the reliability growth trend for repairable systems: homogeneous Poisson failures (HPP) vs. non-homogenous Poisson failures (NHPP). For NHPP, a modified Crow estimate is used to generate the estimate of the module failure intensity, based on which the demand for spare modules is forecasted by considering the installation rate of new systems in the field. To obtain the repair rate estimate for defective modules, the uncertainty in the transition time of the defective modules to the repair center and the product failure modes are appropriately combined to estimate the mean and the variance of the repair rate. Then the service quality index is derived based on the repair rate and the expected failed modules from field systems. Finally a computerized inventory management system is automated using PC-based MS Visual Basic and Excel programs.
AB - Impact of reliability growth on repairable inventory with the application to semiconductor test equipment is discussed and analyzed in this paper. Semiconductor test equipment is capital-intensive product built with swappable and repairable modules (i.e. printed-circuit-boards) to facilitate the maintenance and repair of the system. A stochastic inventory model is proposed to estimate the demand rate for defective modules considering the reliability growth and the increase of field system installations. Three test statistics, the Laplace test, the nonparametric test and the Crow/AMSAA, are used to examine the reliability growth trend for repairable systems: homogeneous Poisson failures (HPP) vs. non-homogenous Poisson failures (NHPP). For NHPP, a modified Crow estimate is used to generate the estimate of the module failure intensity, based on which the demand for spare modules is forecasted by considering the installation rate of new systems in the field. To obtain the repair rate estimate for defective modules, the uncertainty in the transition time of the defective modules to the repair center and the product failure modes are appropriately combined to estimate the mean and the variance of the repair rate. Then the service quality index is derived based on the repair rate and the expected failed modules from field systems. Finally a computerized inventory management system is automated using PC-based MS Visual Basic and Excel programs.
KW - Reliability growth
KW - Repairable inventory
KW - Service quality index
UR - http://www.scopus.com/inward/record.url?scp=45149087819&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=45149087819&partnerID=8YFLogxK
U2 - 10.1109/COASE.2006.326904
DO - 10.1109/COASE.2006.326904
M3 - Conference contribution
AN - SCOPUS:45149087819
SN - 1424403103
SN - 9781424403103
T3 - 2006 IEEE International Conference on Automation Science and Engineering, CASE
SP - 336
EP - 341
BT - 2006 IEEE International Conference on Automation Science and Engineering, CASE
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2006 IEEE International Conference on Automation Science and Engineering, CASE
Y2 - 8 October 2006 through 10 October 2006
ER -