@article{13b051dd16614aaa950c4f622929e8ea,
title = "Comparison of power dependence of microwave surface resistance of unpatterned and patterned YBCO thin film",
abstract = "The effect of the patterning process on the nonlinearity of the microwave surface resistance R$ of YBCO thin films is investigated in this paper. With the use of a sapphire dielectric resonator and a stripline resonator, the microwave R§ of YBCO thin films was measured before and after the patterning process, as a function of temperature and the RF peak magnetic field in the film. The microwave loss was also modeled, assuming a Jrf dependence of Zs(Jrf) on current density Jrf. Experimental and modeled results show that the patterning has no observable effect on the microwave residual RS or on the power dependence of R$.",
keywords = "High-temperature superconductors, Superconducting films, Superconducting materials measurements, Superconducting microwave devices, Superconducting resonators",
author = "Hao Xin and Oates, {Daniel E.} and Anderson, {A. C.}",
note = "Funding Information: Manuscript received January 30, 2000. This work was supported by the Air Force Office of Scientific Research. H. Xin is with the Department of Physics, Massachusetts Institute of Technology, Cambridge, MA 02139 USA., and is also with the Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, MA 02420 USA, and the Air Force Research Laboratory, Hanscom AFB, Bedford, MA 01731 USA. D. E. Oates is with the Department of Physics, Massachusetts Institute of Technology, Cambridge, MA 02139 USA., and also with the Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, MA 02420 USA. A. C. Anderson and R. L. Slattery are with the Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, MA 02420 USA. G. Dresselhaus is with the Department of Physics, Massachusetts Institute of Technology, Cambridge, MA 02139 USA., and is also with the Air Force Research Laboratory, Hanscom AFB, Bedford, MA 01731 USA. M. S. Dresselhaus is with the Department of Physics, Massachusetts Institute of Technology, Cambridge, MA 02139 USA. Publisher Item Identifier S 0018-9480(00)05545-9.",
year = "2000",
doi = "10.1109/22.853465",
language = "English (US)",
volume = "48",
pages = "1221--1226",
journal = "IEEE Transactions on Microwave Theory and Techniques",
issn = "0018-9480",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "7 PART 2",
}