Comparing novel and conventional methods for optical system alignment using deflectometry

Hyemin Yoo, Matthew Dubin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper compares two different ways of aligning optical systems using deflectometry: a novel method incorporating the sine condition test and deflectometry, and conventional multi-field points measuring deflectometry. The study aims to provide experimental evidence that the novel method is effective and has advantages over the conventional method. The experiment was carried out using a singlet as the unit-under-test with visible deflectometry composed of a camera and a monitor. In the conventional approach, the camera is moved to multiple field points to measure transmitted wavefront aberrations. For the accurate measurement of the aberrations, accurate knowledge of the camera positions is desired for conventional deflectometry. In the novel approach, the camera is fixed at an on-axis field point, while the monitor is moved to at least two positions in the longitudinal direction. Even if the camera is fixed, the new method can derive the linear behavior of aberrations over the field as it measures pupil mapping error and slope mapping error instead of wavefront error directly. Also, it is insensitive to positional errors in the monitor. This is made possible by discovering the complementary aspects of the sine condition test and deflectometry. We emphasize that the new alignment method is not performing two independent tests separately. The test can be done via one test setup requiring a camera and a monitor equivalent to a deflectometry system. The results demonstrate the benefits of the novel alignment method, which eliminates the need for accurate control of the test instrument movement during the alignment process.

Original languageEnglish (US)
Title of host publicationOptomechanical Engineering 2023
EditorsKeith B. Doyle, Brandon D. Chalifoux, Kenneth R. Castle, Jose M. Sasian
PublisherSPIE
ISBN (Electronic)9781510665521
DOIs
StatePublished - 2023
EventOptomechanical Engineering 2023 - San Diego, United States
Duration: Aug 23 2023 → …

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12669
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptomechanical Engineering 2023
Country/TerritoryUnited States
CitySan Diego
Period8/23/23 → …

Keywords

  • alignment
  • deflectometry
  • Optical alignment
  • sine condition test

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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