Combining a scanning near-field optical microscope with a picosecond streak camera: Statistical analysis of exciton kinetics in GaAs single-quantum wells

U. Neuberth; L. Walter; G. Von Freymann; B. Dal Don; H. Kalt; M. Wegener; G. Khitrova; H. M. Gibbs

doi:10.1063/1.1477274

Combining a scanning near-field optical microscope with a picosecond streak camera: Statistical analysis of exciton kinetics in GaAs single-quantum wells

U. Neuberth, L. Walter, G. Von Freymann, B. Dal Don, H. Kalt, M. Wegener, G. Khitrova, H. M. Gibbs

Optical Sciences, College of

Research output: Contribution to journal › Article › peer-review

18 Scopus citations

Abstract

Combining a low-temperature scanning near-field optical microscope with a picosecond streak camera allows us to measure the complete wavelength-time behavior at one spot on the sample within about 13 min at excitation powers of 100 nW. We use this instrument to measure the variation of relaxation times in disordered single-GaAs quantum wells with sample position.

Original language	English (US)
Pages (from-to)	3340-3342
Number of pages	3
Journal	Applied Physics Letters
Volume	80
Issue number	18
DOIs	https://doi.org/10.1063/1.1477274
State	Published - May 6 2002

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

Access to Document

10.1063/1.1477274

Cite this

@article{84d59b6a39214aeba7fde9346d95e88a,

title = "Combining a scanning near-field optical microscope with a picosecond streak camera: Statistical analysis of exciton kinetics in GaAs single-quantum wells",

abstract = "Combining a low-temperature scanning near-field optical microscope with a picosecond streak camera allows us to measure the complete wavelength-time behavior at one spot on the sample within about 13 min at excitation powers of 100 nW. We use this instrument to measure the variation of relaxation times in disordered single-GaAs quantum wells with sample position.",

author = "U. Neuberth and L. Walter and {Von Freymann}, G. and {Dal Don}, B. and H. Kalt and M. Wegener and G. Khitrova and Gibbs, {H. M.}",

year = "2002",

month = may,

day = "6",

doi = "10.1063/1.1477274",

language = "English (US)",

volume = "80",

pages = "3340--3342",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "18",

}

TY - JOUR

T1 - Combining a scanning near-field optical microscope with a picosecond streak camera

T2 - Statistical analysis of exciton kinetics in GaAs single-quantum wells

AU - Neuberth, U.

AU - Walter, L.

AU - Von Freymann, G.

AU - Dal Don, B.

AU - Kalt, H.

AU - Wegener, M.

AU - Khitrova, G.

AU - Gibbs, H. M.

PY - 2002/5/6

Y1 - 2002/5/6

N2 - Combining a low-temperature scanning near-field optical microscope with a picosecond streak camera allows us to measure the complete wavelength-time behavior at one spot on the sample within about 13 min at excitation powers of 100 nW. We use this instrument to measure the variation of relaxation times in disordered single-GaAs quantum wells with sample position.

AB - Combining a low-temperature scanning near-field optical microscope with a picosecond streak camera allows us to measure the complete wavelength-time behavior at one spot on the sample within about 13 min at excitation powers of 100 nW. We use this instrument to measure the variation of relaxation times in disordered single-GaAs quantum wells with sample position.

UR - http://www.scopus.com/inward/record.url?scp=79956020823&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79956020823&partnerID=8YFLogxK

U2 - 10.1063/1.1477274

DO - 10.1063/1.1477274

M3 - Article

AN - SCOPUS:79956020823

SN - 0003-6951

VL - 80

SP - 3340

EP - 3342

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 18

ER -

Combining a scanning near-field optical microscope with a picosecond streak camera: Statistical analysis of exciton kinetics in GaAs single-quantum wells

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this