Collection efficiency of CdZnTe detectors

G. C. Giakos, S. Vedantham, J. Odogba

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

In this work, the detection of signal charge produced by x-rays incident on resistive CdZnTe semiconductor substrates, at different detector geometries, within the x-ray diagnostic energy range, is investigated. The experimental results suggest that the observed signal-to-noise ratio is dependent upon the choice of the polarizing electrodes that is directly exposed to the incident x-ray beam. An efficient charge detection is achieved achieved when the x-ray beam is incident on the negative electrode with the electric field parallel to the direction of the incoming photons.

Original languageEnglish (US)
Title of host publicationIMTC 1997 - IEEE Instrumentation and Measurement Technology Conference
Subtitle of host publicationSensing, Processing, Networking, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages8-11
Number of pages4
ISBN (Electronic)0780337476
DOIs
StatePublished - 1997
Externally publishedYes
Event14th Annual IEEE Instrumentation and Measurement Technology Conference, IMTC 1997 - Ottawa, Canada
Duration: May 19 1997May 21 1997

Publication series

NameConference Record - IEEE Instrumentation and Measurement Technology Conference
Volume1
ISSN (Print)1091-5281

Conference

Conference14th Annual IEEE Instrumentation and Measurement Technology Conference, IMTC 1997
Country/TerritoryCanada
CityOttawa
Period5/19/975/21/97

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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