TY - GEN
T1 - Collection efficiency of CdZnTe detectors
AU - Giakos, G. C.
AU - Vedantham, S.
AU - Odogba, J.
N1 - Publisher Copyright:
© 1997 IEEE.
PY - 1997
Y1 - 1997
N2 - In this work, the detection of signal charge produced by x-rays incident on resistive CdZnTe semiconductor substrates, at different detector geometries, within the x-ray diagnostic energy range, is investigated. The experimental results suggest that the observed signal-to-noise ratio is dependent upon the choice of the polarizing electrodes that is directly exposed to the incident x-ray beam. An efficient charge detection is achieved achieved when the x-ray beam is incident on the negative electrode with the electric field parallel to the direction of the incoming photons.
AB - In this work, the detection of signal charge produced by x-rays incident on resistive CdZnTe semiconductor substrates, at different detector geometries, within the x-ray diagnostic energy range, is investigated. The experimental results suggest that the observed signal-to-noise ratio is dependent upon the choice of the polarizing electrodes that is directly exposed to the incident x-ray beam. An efficient charge detection is achieved achieved when the x-ray beam is incident on the negative electrode with the electric field parallel to the direction of the incoming photons.
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U2 - 10.1109/IMTC.1997.603906
DO - 10.1109/IMTC.1997.603906
M3 - Conference contribution
AN - SCOPUS:0030676905
T3 - Conference Record - IEEE Instrumentation and Measurement Technology Conference
SP - 8
EP - 11
BT - IMTC 1997 - IEEE Instrumentation and Measurement Technology Conference
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 14th Annual IEEE Instrumentation and Measurement Technology Conference, IMTC 1997
Y2 - 19 May 1997 through 21 May 1997
ER -