TY - GEN
T1 - Clockless spin-based look-up tables with wide read margin
AU - Salehi, Soheil
AU - Zand, Ramtin
AU - Demara, Ronald F.
N1 - Publisher Copyright:
© 2019 ACM.
PY - 2019/5/13
Y1 - 2019/5/13
N2 - In this paper, we develop a 6-input fracturable non-volatile Clockless LUT (C-LUT) using spin Hall effect (SHE)-based Magnetic Tunnel Junctions (MTJs) and provide a detailed comparison between the SHE-MTJ-based C-LUT and Spin Transfer Torque (STT)-MTJ-based C-LUT. The proposed C-LUT offers an attractive alternative for implementing combinational logic as well as sequential logic versus previous spin-based LUT designs in the literature. Foremost, C-LUT eliminates the sense amplifier typically employed by using a differential polarity dual MTJ design, as opposed to a static reference resistance MTJ. This realizes a much wider read margin and the Monte Carlo simulation of the proposed fracturable C-LUT indicates no read and write errors in the presence of a variety of process variations scenarios involving MOS transistors as well as MTJs. Additionally, simulation results indicate that the proposed C-LUT reduces the standby power dissipation by 5.4-fold compared to the SRAM-based LUT. Furthermore, the proposed SHE-MTJ-based C-LUT reduces the area by 1.3-fold and 2-fold compared to the SRAM-based LUT and the STT-MTJ-based C-LUT, respectively.
AB - In this paper, we develop a 6-input fracturable non-volatile Clockless LUT (C-LUT) using spin Hall effect (SHE)-based Magnetic Tunnel Junctions (MTJs) and provide a detailed comparison between the SHE-MTJ-based C-LUT and Spin Transfer Torque (STT)-MTJ-based C-LUT. The proposed C-LUT offers an attractive alternative for implementing combinational logic as well as sequential logic versus previous spin-based LUT designs in the literature. Foremost, C-LUT eliminates the sense amplifier typically employed by using a differential polarity dual MTJ design, as opposed to a static reference resistance MTJ. This realizes a much wider read margin and the Monte Carlo simulation of the proposed fracturable C-LUT indicates no read and write errors in the presence of a variety of process variations scenarios involving MOS transistors as well as MTJs. Additionally, simulation results indicate that the proposed C-LUT reduces the standby power dissipation by 5.4-fold compared to the SRAM-based LUT. Furthermore, the proposed SHE-MTJ-based C-LUT reduces the area by 1.3-fold and 2-fold compared to the SRAM-based LUT and the STT-MTJ-based C-LUT, respectively.
KW - Fracturable lut
KW - Magnetic tunnel junction
KW - Reconfigurable logic
KW - Spin hall effect
KW - Spin transfer torque
KW - Spin-based memory cell
UR - https://www.scopus.com/pages/publications/85077343098
UR - https://www.scopus.com/pages/publications/85077343098#tab=citedBy
U2 - 10.1145/3299874.3318038
DO - 10.1145/3299874.3318038
M3 - Conference contribution
AN - SCOPUS:85077343098
T3 - Proceedings of the ACM Great Lakes Symposium on VLSI, GLSVLSI
SP - 363
EP - 366
BT - GLSVLSI 2019 - Proceedings of the 2019 Great Lakes Symposium on VLSI
PB - Association for Computing Machinery
T2 - 29th Great Lakes Symposium on VLSI, GLSVLSI 2019
Y2 - 9 May 2019 through 11 May 2019
ER -