Charge writing in silicon-silicon dioxide for nano-assembly

Keyphrases

• Silicon Dioxide 100%
• Nanoassemblies 100%
• Charge Writing 100%
• Spot Size 66%
• Electret 33%
• Si-SiO2 33%
• Size Stability 33%
• Hexamethyldisilazane 33%
• Si-SiO2 Interface 33%
• Last Five Years 33%
• Lateral Spread 33%
• Charge Model 33%
• Mathematical Analysis 33%

Engineering

• Spot Size 100%
• Air Interface 50%
• Lateral Spread 50%
• Negative Charge 50%
• Conducted Experiment 50%
• Electret 50%

Material Science

• Charge Trapping 33%
• Electret 33%