Charge injection device detectors for x-ray imaging

Robert F. Wentink, Joseph Carbone, D. C. Aloisi, Walter M. Gibson, Carolyn A. MacDonald, Q. E. Hanley, Robert E. Fields, M. B. Denton

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations


Charge Injection Device (CID) array detectors are well suited for the direct imaging with x- ray and particle beams. In common with CCD detectors, CID arrays have been shown to have good spatial resolution and broad spectral response in the visible range. In addition, CID imagers offer unique architectural features which may be particularly applicable to x-ray and particle beams, including exceptionally large pixel charge capacity, non-destructive pixel readout, and random pixel addressibility. These can dramatically extend the dynamic range, eliminate blooming effects, allow monitoring and dynamic adaptation of application exposure in real-time, improve signal-to-noise by repeated readout and permit the readout of small pixel sub-arrays at exceptionally fast rates. In addition CIDs possess extremely good radiation tolerance. Preliminary results of x-ray measurements with CIDs are presented along with a discussion of potential applications utilizing their unique features.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Number of pages8
ISBN (Print)0819416037
StatePublished - 1994
EventAdvances in Multilayer and Grazing Incidence X-Ray/EUV/FUV Optics - San Diego, CA, USA
Duration: Jul 24 1994Jul 26 1994

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X


OtherAdvances in Multilayer and Grazing Incidence X-Ray/EUV/FUV Optics
CitySan Diego, CA, USA

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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