Abstract
Charge coupled devices (CCDs) have been the most common high performance imaging detector for nearly all scientific and industrial imaging applications since the 1980s. In this chapter the CCD imager and its use for high performance imaging are described. The focus is on scientific and industrial applications which require quantitative measurements of the incident scene, especially in low light level conditions and when spectral information is also required. The architecture and operation of CCDs as well as their quantitative characterization and most important operational parameters are also described.
| Original language | English (US) |
|---|---|
| Title of host publication | High Performance Silicon Imaging |
| Subtitle of host publication | Fundamentals and Applications of CMOS and CCD sensors |
| Publisher | Elsevier Inc. |
| Pages | 78-97 |
| Number of pages | 20 |
| ISBN (Electronic) | 9780857097521 |
| ISBN (Print) | 9780857095985 |
| DOIs | |
| State | Published - May 14 2014 |
Keywords
- Charge coupled devices
- Detectors
- Scientific imaging
- Sensors
ASJC Scopus subject areas
- Engineering(all)