Characterizing the impact of conductor surface roughness on CB-CPW behavior via reduced computational complexity

Arghya Sain; Kathleen L. Melde

doi:10.1109/EPEPS.2012.6457891

Characterizing the impact of conductor surface roughness on CB-CPW behavior via reduced computational complexity

Arghya Sain, Kathleen L. Melde

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Scopus citations

Abstract

This paper presents a way to include the effects of conductor surface roughness in three-dimensional full wave simulation tools. A comparison of the computational load and attenuation coefficient as a function of the number and area of different surfaces roughened is given.

Original language	English (US)
Title of host publication	2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012
Pages	260-263
Number of pages	4
DOIs	https://doi.org/10.1109/EPEPS.2012.6457891
State	Published - 2012
Event	2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012 - Tempe, AZ, United States Duration: Oct 21 2012 → Oct 24 2012

Publication series

Name	2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012

Other

Other	2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012
Country/Territory	United States
City	Tempe, AZ
Period	10/21/12 → 10/24/12

Keywords

autocorrelation function (ACF)
conductor backed coplanar waveguide (CB-CPW)
conductor loss
interconnect
root mean square height (Hrms)
surface roughness
transmission lines

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/EPEPS.2012.6457891

Cite this

Sain, A., & Melde, K. L. (2012). Characterizing the impact of conductor surface roughness on CB-CPW behavior via reduced computational complexity. In 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012 (pp. 260-263). Article 6457891 (2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012). https://doi.org/10.1109/EPEPS.2012.6457891

Characterizing the impact of conductor surface roughness on CB-CPW behavior via reduced computational complexity. / Sain, Arghya; Melde, Kathleen L.
2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012. 2012. p. 260-263 6457891 (2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Sain, A & Melde, KL 2012, Characterizing the impact of conductor surface roughness on CB-CPW behavior via reduced computational complexity. in 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012., 6457891, 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012, pp. 260-263, 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012, Tempe, AZ, United States, 10/21/12. https://doi.org/10.1109/EPEPS.2012.6457891

Sain A, Melde KL. Characterizing the impact of conductor surface roughness on CB-CPW behavior via reduced computational complexity. In 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012. 2012. p. 260-263. 6457891. (2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012). doi: 10.1109/EPEPS.2012.6457891

Sain, Arghya ; Melde, Kathleen L. / Characterizing the impact of conductor surface roughness on CB-CPW behavior via reduced computational complexity. 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012. 2012. pp. 260-263 (2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2012).

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keywords = "autocorrelation function (ACF), conductor backed coplanar waveguide (CB-CPW), conductor loss, interconnect, root mean square height (Hrms), surface roughness, transmission lines",

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Characterizing the impact of conductor surface roughness on CB-CPW behavior via reduced computational complexity

Abstract

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Keywords

ASJC Scopus subject areas

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