Characterizing persistence in JWST NIRCam flight detectors

Jarron M. Leisenring, Marcia J Rieke, Karl Misselt, Massimo Robberto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations


Near-IR detectors are commonly reported to display latent images persisting between integration ramps. After array reset, pixels previously subjected to illumination show an anomalous charge accumulation rate that is initially high but decreases to dark-current levels after several hundred seconds. Depending on the flux intensity and observation time, the resulting persistence can dramatically affect science observations if not properly understood. We characterize the persistent behavior of JWST/NIRCam's flight detectors with respect to source intensity, pixel dwell time, and well fill level in order to better understand the underlying physical processes contributing to this phenomenon. Results show that the coefficients of functional fits to the latent signal directly correlate with the stimulating flux as well as the pixel dwell time, enabling predictions of the latent emission. Such relationships provide the potential to model and remove the majority of the persistent flux in NIRCam detectors. Because NIRCam lacks internal calibration lamps, we discuss other alternatives to characterize per-sistence during flight operations.

Original languageEnglish (US)
Title of host publicationHigh Energy, Optical, and Infrared Detectors for Astronomy VII
EditorsAndrew D. Holland, James Beletic
ISBN (Electronic)9781510602090
StatePublished - 2016
EventHigh Energy, Optical, and Infrared Detectors for Astronomy VII - Edinburgh, United Kingdom
Duration: Jun 26 2016Jun 29 2016

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


OtherHigh Energy, Optical, and Infrared Detectors for Astronomy VII
Country/TerritoryUnited Kingdom


  • JWST
  • Latent Images
  • NIRCam
  • Near Infrared
  • Persistence

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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