@inproceedings{762878f568fd49a58510dc58d0448035,
title = "Characterizing dielectric tensors with biaxial ellipsometry",
abstract = "Dielectric tensors of liquid crystal polymer retarder films are determined by measuring the sample with an angle-of-incidence Mueller matrix imaging polarimeter. An optimization routine finds the dielectric tensor that best fits the Mueller matrix data.",
author = "Smith, {Paula K.} and McClain, {Stephen C.} and Chipman, {Russell A.}",
year = "2008",
doi = "10.1364/fio.2008.fwe8",
language = "English (US)",
isbn = "9781557528612",
series = "Optics InfoBase Conference Papers",
publisher = "Optical Society of America (OSA)",
booktitle = "Frontiers in Optics, FiO 2008",
note = "Frontiers in Optics, FiO 2008 ; Conference date: 19-10-2008 Through 23-10-2008",
}