Characterizing dielectric tensors with Biaxial ellipsometry

Paula K. Smith, Stephen C. McClain, Russell A. Chipman

Research output: Contribution to journalConference articlepeer-review


Dielectric tensors of anisotropic substrates and films can be determined by biaxial ellipsometry, an extension of conventional ellipsometry. This technique utilizes an angle-of-incidence Mueller matrix imaging polarimeter. An example of the determination of the dielectric tensor of liquid crystal polymer films for retarders is presented.

Original languageEnglish (US)
Pages (from-to)1533-1536
Number of pages4
JournalDigest of Technical Papers - SID International Symposium
Issue number1
StatePublished - 2008
Event2008 SID International Symposium - Los Angeles, CA, United States
Duration: May 20 2008May 21 2008

ASJC Scopus subject areas

  • General Engineering


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