Characterizing dielectric tensors with Biaxial ellipsometry

Paula K. Smith; Stephen C. McClain; Russell A. Chipman

doi:10.1889/1.3069450

Characterizing dielectric tensors with Biaxial ellipsometry

Paula K. Smith, Stephen C. McClain, Russell A. Chipman

Research output: Contribution to journal › Conference article › peer-review

Abstract

Dielectric tensors of anisotropic substrates and films can be determined by biaxial ellipsometry, an extension of conventional ellipsometry. This technique utilizes an angle-of-incidence Mueller matrix imaging polarimeter. An example of the determination of the dielectric tensor of liquid crystal polymer films for retarders is presented.

Original language	English (US)
Pages (from-to)	1533-1536
Number of pages	4
Journal	Digest of Technical Papers - SID International Symposium
Volume	39
Issue number	1
DOIs	https://doi.org/10.1889/1.3069450
State	Published - 2008
Event	2008 SID International Symposium - Los Angeles, CA, United States Duration: May 20 2008 → May 21 2008

ASJC Scopus subject areas

General Engineering

Access to Document

10.1889/1.3069450

Cite this

@article{859c1d3bb4d54f5284988672679fe75e,

title = "Characterizing dielectric tensors with Biaxial ellipsometry",

abstract = "Dielectric tensors of anisotropic substrates and films can be determined by biaxial ellipsometry, an extension of conventional ellipsometry. This technique utilizes an angle-of-incidence Mueller matrix imaging polarimeter. An example of the determination of the dielectric tensor of liquid crystal polymer films for retarders is presented.",

author = "Smith, {Paula K.} and McClain, {Stephen C.} and Chipman, {Russell A.}",

year = "2008",

doi = "10.1889/1.3069450",

language = "English (US)",

volume = "39",

pages = "1533--1536",

journal = "Digest of Technical Papers - SID International Symposium",

issn = "0097-966X",

publisher = "John Wiley and Sons Inc.",

number = "1",

note = "2008 SID International Symposium ; Conference date: 20-05-2008 Through 21-05-2008",

}

TY - JOUR

T1 - Characterizing dielectric tensors with Biaxial ellipsometry

AU - Smith, Paula K.

AU - McClain, Stephen C.

AU - Chipman, Russell A.

PY - 2008

Y1 - 2008

N2 - Dielectric tensors of anisotropic substrates and films can be determined by biaxial ellipsometry, an extension of conventional ellipsometry. This technique utilizes an angle-of-incidence Mueller matrix imaging polarimeter. An example of the determination of the dielectric tensor of liquid crystal polymer films for retarders is presented.

AB - Dielectric tensors of anisotropic substrates and films can be determined by biaxial ellipsometry, an extension of conventional ellipsometry. This technique utilizes an angle-of-incidence Mueller matrix imaging polarimeter. An example of the determination of the dielectric tensor of liquid crystal polymer films for retarders is presented.

UR - http://www.scopus.com/inward/record.url?scp=54549108856&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=54549108856&partnerID=8YFLogxK

U2 - 10.1889/1.3069450

DO - 10.1889/1.3069450

M3 - Conference article

AN - SCOPUS:54549108856

SN - 0097-966X

VL - 39

SP - 1533

EP - 1536

JO - Digest of Technical Papers - SID International Symposium

JF - Digest of Technical Papers - SID International Symposium

IS - 1

T2 - 2008 SID International Symposium

Y2 - 20 May 2008 through 21 May 2008

ER -

Characterizing dielectric tensors with Biaxial ellipsometry

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this