@inproceedings{212ab899e2124d878897c0f9c683231d,
title = "Characterization of the optical properties of the buried contact of the JWST MIRI Si: As infrared blocked impurity band detectors",
abstract = "The Mid-Infrared Instrument MIRI on-board the James Webb Space Telescope uses three Si:As impurity band conduction detector arrays. MIRI medium resolution spectroscopic measurements (R∼3500-1500) in the 5 μm to 28 μm wavelength range show a 10-30% modulation of the spectral baseline; coherent reflections of infrared light within the Si:As detector arrays result in fringing. We quantify the shape and impact of fringes on spectra of optical sources observed with MIRI during ground testing and develop an optical model to simulate the observed modulation. We use our optical model in conjunction with the MIRI spectroscopic data to show that the properties of the buried contact inside the MIRI Si:As detector have a significant effect on the fringing behavior.",
keywords = "Doping concentration, Fringing buried contact, James Webb Space Telescope, Mid infrared instrument MIRI, Refractive index, Si:As impurity band conduction device, Spectroscopy",
author = "Ioannis Argyriou and Rieke, {George H.} and Ressler, {Michael E.} and Andr{\'a}s G{\'a}sp{\'a}r and Bart Vandenbussche",
note = "Funding Information: We would like to thank the following National and International Funding Agencies for their support of the MIRI development: NASA; ESA; Belgian Science Policy Office; Centre Nationale D{\textquoteright}Etudes Spatiales (CNES); Danish National Space Centre; Deutsches Zentrum fur Luft-und Raumfahrt (DLR); Enterprise Ireland; Ministerio De Economi{\'a} y Competividad; Netherlands Research School for Astronomy (NOVA); Netherlands Organisation for Scientific Research (NWO); Science and Technology Facilities Council; Swiss Space Office; Swedish National Space Board; UK Space Agency. Publisher Copyright: {\textcopyright} SPIE. Downloading of the abstract is permitted for personal use only.; X-Ray, Optical, and Infrared Detectors for Astronomy IX 2020 ; Conference date: 14-12-2020 Through 22-12-2020",
year = "2020",
doi = "10.1117/12.2561502",
language = "English (US)",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Holland, {Andrew D.} and James Beletic",
booktitle = "X-Ray, Optical, and Infrared Detectors for Astronomy IX",
}