Characterization of Pt/TiO2 surfaces by means of photoelectron spectroscopy of adsorbed xenon

P. Dolle; K. Markert; W. Heichier; N. R. Armstrong; K. Wandelt

doi:10.1116/1.573538

Characterization of Pt/TiO₂ surfaces by means of photoelectron spectroscopy of adsorbed xenon

P. Dolle, K. Markert, W. Heichier, N. R. Armstrong, K. Wandelt

Chemistry and Biochemistry

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Abstract

Photoelectron spectroscopy of adsorbed Xe (PAX) was used to characterize various Pt/TiO₂ (100) surfaces on an atomic scale. The PAX data provide useful information on both geometrical and electronic states of various surface sites. For example, both Ar ion sputtering and high temperature annealing (850°C) in vacuum produce a distribution of (charge density) surface defect sites, most likely Ti³⁺and Ti²⁺ whose local surface potentials are higher than on a stoichiometric TiO₂ surface by 0.5 and 1 eV, respectively. Submonolayer deposits of Pt on a stoichiometric TiO₂ exhibits much lower local surface potentials (0.5-1 eV) than sputter-roughened bulk Pt, suggesting modified charge densities at these sites.

Original language	English (US)
Pages (from-to)	1465-1466
Number of pages	2
Journal	Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume	4
Issue number	3
DOIs	https://doi.org/10.1116/1.573538
State	Published - May 1986

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films

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title = "Characterization of Pt/TiO2 surfaces by means of photoelectron spectroscopy of adsorbed xenon",

abstract = "Photoelectron spectroscopy of adsorbed Xe (PAX) was used to characterize various Pt/TiO2 (100) surfaces on an atomic scale. The PAX data provide useful information on both geometrical and electronic states of various surface sites. For example, both Ar ion sputtering and high temperature annealing (850°C) in vacuum produce a distribution of (charge density) surface defect sites, most likely Ti3+and Ti2+ whose local surface potentials are higher than on a stoichiometric TiO2 surface by 0.5 and 1 eV, respectively. Submonolayer deposits of Pt on a stoichiometric TiO2 exhibits much lower local surface potentials (0.5-1 eV) than sputter-roughened bulk Pt, suggesting modified charge densities at these sites.",

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T1 - Characterization of Pt/TiO2 surfaces by means of photoelectron spectroscopy of adsorbed xenon

AU - Dolle, P.

AU - Markert, K.

AU - Heichier, W.

AU - Armstrong, N. R.

AU - Wandelt, K.

PY - 1986/5

Y1 - 1986/5

N2 - Photoelectron spectroscopy of adsorbed Xe (PAX) was used to characterize various Pt/TiO2 (100) surfaces on an atomic scale. The PAX data provide useful information on both geometrical and electronic states of various surface sites. For example, both Ar ion sputtering and high temperature annealing (850°C) in vacuum produce a distribution of (charge density) surface defect sites, most likely Ti3+and Ti2+ whose local surface potentials are higher than on a stoichiometric TiO2 surface by 0.5 and 1 eV, respectively. Submonolayer deposits of Pt on a stoichiometric TiO2 exhibits much lower local surface potentials (0.5-1 eV) than sputter-roughened bulk Pt, suggesting modified charge densities at these sites.

AB - Photoelectron spectroscopy of adsorbed Xe (PAX) was used to characterize various Pt/TiO2 (100) surfaces on an atomic scale. The PAX data provide useful information on both geometrical and electronic states of various surface sites. For example, both Ar ion sputtering and high temperature annealing (850°C) in vacuum produce a distribution of (charge density) surface defect sites, most likely Ti3+and Ti2+ whose local surface potentials are higher than on a stoichiometric TiO2 surface by 0.5 and 1 eV, respectively. Submonolayer deposits of Pt on a stoichiometric TiO2 exhibits much lower local surface potentials (0.5-1 eV) than sputter-roughened bulk Pt, suggesting modified charge densities at these sites.

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Characterization of Pt/TiO₂ surfaces by means of photoelectron spectroscopy of adsorbed xenon

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