Characterization of orthogonal transfer array CCDs for the WIYN one degree imager

Michael Lesser; David Ouellette; Todd Boroson; Daniel Harbeck; Pierre Martin; George Jacoby; John Cavin; David Sawyer; Kasey Boggs; Richard Bredthauer

doi:10.1117/12.908376

Characterization of orthogonal transfer array CCDs for the WIYN one degree imager

Michael Lesser, David Ouellette, Todd Boroson, Daniel Harbeck, Pierre Martin, George Jacoby, John Cavin, David Sawyer, Kasey Boggs, Richard Bredthauer

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Scopus citations

Abstract

The WIYN One Degree Imager (ODI) will provide a one degree field of view for the WIYN 3.5 m telescope located on Kitt Peak near Tucson, Arizona. Its focal plane consists of an 8x8 grid of Orthogonal Transfer Array (OTA) CCD detectors. These detectors are the STA2200 OTA CCDs designed and fabricated by Semiconductor Technology Associates, Inc. and backside processed at the University of Arizona Imaging Technology Laboratory. Several lot runs of the STA2200 detectors have been fabricated. We have backside processed devices from these different lots and provide detector performance characterization, including noise, CTE, cosmetics, quantum efficiency, and some orthogonal transfer characteristics. We discuss the performance differences for the devices with different silicon thickness and resistivity. A fully buttable custom detector package has been developed for this project which allows hybridization of the silicon detectors directly onto an aluminum nitride substrate with an embedded pin grid array. This package is mounted on a silicon-aluminum alloy which provides a flat imaging surface of less than 20 microns peakvalley at the -100 C operating temperature. Characterization of the package performance, including low temperature profilometry, is described in this paper.

Original language	English (US)
Title of host publication	Proceedings of SPIE-IS and T Electronic Imaging - Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII
Publisher	SPIE
ISBN (Print)	9780819489456
DOIs	https://doi.org/10.1117/12.908376
State	Published - 2012
Event	Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII - Burlingame, CA, United States Duration: Jan 25 2012 → Jan 26 2012

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	8298
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Other

Other	Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII
Country/Territory	United States
City	Burlingame, CA
Period	1/25/12 → 1/26/12

Keywords

CCDs
Detectors
Imaging
Telescopes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.908376

Cite this

Lesser, M., Ouellette, D., Boroson, T., Harbeck, D., Martin, P., Jacoby, G., Cavin, J., Sawyer, D., Boggs, K., & Bredthauer, R. (2012). Characterization of orthogonal transfer array CCDs for the WIYN one degree imager. In Proceedings of SPIE-IS and T Electronic Imaging - Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII Article 82980O (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8298). SPIE. https://doi.org/10.1117/12.908376

Characterization of orthogonal transfer array CCDs for the WIYN one degree imager. / Lesser, Michael; Ouellette, David; Boroson, Todd et al.
Proceedings of SPIE-IS and T Electronic Imaging - Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII. SPIE, 2012. 82980O (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8298).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Lesser, M, Ouellette, D, Boroson, T, Harbeck, D, Martin, P, Jacoby, G, Cavin, J, Sawyer, D, Boggs, K & Bredthauer, R 2012, Characterization of orthogonal transfer array CCDs for the WIYN one degree imager. in Proceedings of SPIE-IS and T Electronic Imaging - Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII., 82980O, Proceedings of SPIE - The International Society for Optical Engineering, vol. 8298, SPIE, Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII, Burlingame, CA, United States, 1/25/12. https://doi.org/10.1117/12.908376

Lesser M, Ouellette D, Boroson T, Harbeck D, Martin P, Jacoby G et al. Characterization of orthogonal transfer array CCDs for the WIYN one degree imager. In Proceedings of SPIE-IS and T Electronic Imaging - Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII. SPIE. 2012. 82980O. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.908376

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abstract = "The WIYN One Degree Imager (ODI) will provide a one degree field of view for the WIYN 3.5 m telescope located on Kitt Peak near Tucson, Arizona. Its focal plane consists of an 8x8 grid of Orthogonal Transfer Array (OTA) CCD detectors. These detectors are the STA2200 OTA CCDs designed and fabricated by Semiconductor Technology Associates, Inc. and backside processed at the University of Arizona Imaging Technology Laboratory. Several lot runs of the STA2200 detectors have been fabricated. We have backside processed devices from these different lots and provide detector performance characterization, including noise, CTE, cosmetics, quantum efficiency, and some orthogonal transfer characteristics. We discuss the performance differences for the devices with different silicon thickness and resistivity. A fully buttable custom detector package has been developed for this project which allows hybridization of the silicon detectors directly onto an aluminum nitride substrate with an embedded pin grid array. This package is mounted on a silicon-aluminum alloy which provides a flat imaging surface of less than 20 microns peakvalley at the -100 C operating temperature. Characterization of the package performance, including low temperature profilometry, is described in this paper.",

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doi = "10.1117/12.908376",

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AU - Jacoby, George

AU - Cavin, John

AU - Sawyer, David

AU - Boggs, Kasey

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AB - The WIYN One Degree Imager (ODI) will provide a one degree field of view for the WIYN 3.5 m telescope located on Kitt Peak near Tucson, Arizona. Its focal plane consists of an 8x8 grid of Orthogonal Transfer Array (OTA) CCD detectors. These detectors are the STA2200 OTA CCDs designed and fabricated by Semiconductor Technology Associates, Inc. and backside processed at the University of Arizona Imaging Technology Laboratory. Several lot runs of the STA2200 detectors have been fabricated. We have backside processed devices from these different lots and provide detector performance characterization, including noise, CTE, cosmetics, quantum efficiency, and some orthogonal transfer characteristics. We discuss the performance differences for the devices with different silicon thickness and resistivity. A fully buttable custom detector package has been developed for this project which allows hybridization of the silicon detectors directly onto an aluminum nitride substrate with an embedded pin grid array. This package is mounted on a silicon-aluminum alloy which provides a flat imaging surface of less than 20 microns peakvalley at the -100 C operating temperature. Characterization of the package performance, including low temperature profilometry, is described in this paper.

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KW - Telescopes

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Characterization of orthogonal transfer array CCDs for the WIYN one degree imager

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