Abstract
Conductive-tip atomic force microscopy (C-AFM) is a powerful tool for investigating the electrical characteristics of phase-change materials commonly used for electronic and optical data storage. We demonstrate the usefulness of this technique by examining the electrical conductivity of crystalline marks recorded with a focused laser pulse on a thin Ge2Sb2Te5 film.
Original language | English (US) |
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Pages (from-to) | 1945-1950 |
Number of pages | 6 |
Journal | Physica Status Solidi (B) Basic Research |
Volume | 249 |
Issue number | 10 |
DOIs | |
State | Published - Oct 2012 |
Keywords
- Electronic data storage
- Materials and process characterization
- Optical recording
- Phase-change materials
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics