Characterization of frequency dependent dielectric packaging media using differential and multiple-reflection techniques on a precision stripline test structure

Ch C. Green; J. M. Seligman; J. L. Prince; K. L. Virga

Characterization of frequency dependent dielectric packaging media using differential and multiple-reflection techniques on a precision stripline test structure

Ch C. Green, J. M. Seligman, J. L. Prince, K. L. Virga

Electrical and Computer Engineering

Research output: Contribution to conference › Paper › peer-review

1 Scopus citations

Abstract

The frequency dependent loss tangent and dielectric constant has been determined for various dielectric materials using a stripline test fixture by employing differential and multiple-reflection-based measurement techniques with a vector network analyzer.

Original language	English (US)
Pages	69-72
Number of pages	4
State	Published - 1998
Event	Proceedings of the 1998 IEEE 7th Topical Meeting on Electrical Performance of Electronic Packaging - West Point, NY, USA Duration: Oct 26 1998 → Oct 28 1998

Conference

Conference	Proceedings of the 1998 IEEE 7th Topical Meeting on Electrical Performance of Electronic Packaging
City	West Point, NY, USA
Period	10/26/98 → 10/28/98

ASJC Scopus subject areas

General Engineering

Cite this

Green, C. C., Seligman, J. M., Prince, J. L., & Virga, K. L. (1998). Characterization of frequency dependent dielectric packaging media using differential and multiple-reflection techniques on a precision stripline test structure. 69-72. Paper presented at Proceedings of the 1998 IEEE 7th Topical Meeting on Electrical Performance of Electronic Packaging, West Point, NY, USA.

Characterization of frequency dependent dielectric packaging media using differential and multiple-reflection techniques on a precision stripline test structure. / Green, Ch C.; Seligman, J. M.; Prince, J. L. et al.
1998. 69-72 Paper presented at Proceedings of the 1998 IEEE 7th Topical Meeting on Electrical Performance of Electronic Packaging, West Point, NY, USA.

Research output: Contribution to conference › Paper › peer-review

Green, CC, Seligman, JM, Prince, JL & Virga, KL 1998, 'Characterization of frequency dependent dielectric packaging media using differential and multiple-reflection techniques on a precision stripline test structure', Paper presented at Proceedings of the 1998 IEEE 7th Topical Meeting on Electrical Performance of Electronic Packaging, West Point, NY, USA, 10/26/98 - 10/28/98 pp. 69-72.

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abstract = "The frequency dependent loss tangent and dielectric constant has been determined for various dielectric materials using a stripline test fixture by employing differential and multiple-reflection-based measurement techniques with a vector network analyzer.",

author = "Green, {Ch C.} and Seligman, {J. M.} and Prince, {J. L.} and Virga, {K. L.}",

year = "1998",

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note = "Proceedings of the 1998 IEEE 7th Topical Meeting on Electrical Performance of Electronic Packaging ; Conference date: 26-10-1998 Through 28-10-1998",

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T1 - Characterization of frequency dependent dielectric packaging media using differential and multiple-reflection techniques on a precision stripline test structure

AU - Green, Ch C.

AU - Seligman, J. M.

AU - Prince, J. L.

AU - Virga, K. L.

PY - 1998

Y1 - 1998

N2 - The frequency dependent loss tangent and dielectric constant has been determined for various dielectric materials using a stripline test fixture by employing differential and multiple-reflection-based measurement techniques with a vector network analyzer.

AB - The frequency dependent loss tangent and dielectric constant has been determined for various dielectric materials using a stripline test fixture by employing differential and multiple-reflection-based measurement techniques with a vector network analyzer.

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M3 - Paper

AN - SCOPUS:0032294533

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T2 - Proceedings of the 1998 IEEE 7th Topical Meeting on Electrical Performance of Electronic Packaging

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Characterization of frequency dependent dielectric packaging media using differential and multiple-reflection techniques on a precision stripline test structure

Abstract

Conference

ASJC Scopus subject areas

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