Characterization of coplanar poled electro optic polymer films for Si-photonic devices with multiphoton microscopy

R. Himmelhuber; S. S. Mehravar; O. D. Herrera; V. Demir; K. Kieu; J. Luo; A. K.Y. Jen; R. A. Norwood; N. Peyghambarian

doi:10.1063/1.4872165

Characterization of coplanar poled electro optic polymer films for Si-photonic devices with multiphoton microscopy

R. Himmelhuber, S. S. Mehravar, O. D. Herrera, V. Demir, K. Kieu, J. Luo, A. K.Y. Jen, R. A. Norwood, N. Peyghambarian

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4 Scopus citations

Abstract

We imaged coplanar poled electro optic (EO) polymer films on transparent substrates with a multiple-photon microscope in reflection and correlated the second-harmonic light intensity with the results of Pockels coefficient (r ₃₃) measurements. This allowed us to make quantitative measurements of poled polymer films on non-transparent substrates like silicon, which are not accessible with traditional Pockels coefficient measurement techniques. Phase modulators consisting of silicon waveguide devices with EO polymer claddings with a known Pockels coefficient (from V_π measurements) were used to validate the correlation between the second-harmonic signal and r ₃₃. This also allowed us to locally map the r₃₃ coefficient in the poled area.

Original language	English (US)
Article number	161109
Journal	Applied Physics Letters
Volume	104
Issue number	16
DOIs	https://doi.org/10.1063/1.4872165
State	Published - Apr 21 2014

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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title = "Characterization of coplanar poled electro optic polymer films for Si-photonic devices with multiphoton microscopy",

abstract = "We imaged coplanar poled electro optic (EO) polymer films on transparent substrates with a multiple-photon microscope in reflection and correlated the second-harmonic light intensity with the results of Pockels coefficient (r 33) measurements. This allowed us to make quantitative measurements of poled polymer films on non-transparent substrates like silicon, which are not accessible with traditional Pockels coefficient measurement techniques. Phase modulators consisting of silicon waveguide devices with EO polymer claddings with a known Pockels coefficient (from Vπ measurements) were used to validate the correlation between the second-harmonic signal and r 33. This also allowed us to locally map the r33 coefficient in the poled area.",

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AU - Himmelhuber, R.

AU - Mehravar, S. S.

AU - Herrera, O. D.

AU - Demir, V.

AU - Kieu, K.

AU - Luo, J.

AU - Jen, A. K.Y.

AU - Norwood, R. A.

AU - Peyghambarian, N.

PY - 2014/4/21

Y1 - 2014/4/21

N2 - We imaged coplanar poled electro optic (EO) polymer films on transparent substrates with a multiple-photon microscope in reflection and correlated the second-harmonic light intensity with the results of Pockels coefficient (r 33) measurements. This allowed us to make quantitative measurements of poled polymer films on non-transparent substrates like silicon, which are not accessible with traditional Pockels coefficient measurement techniques. Phase modulators consisting of silicon waveguide devices with EO polymer claddings with a known Pockels coefficient (from Vπ measurements) were used to validate the correlation between the second-harmonic signal and r 33. This also allowed us to locally map the r33 coefficient in the poled area.

AB - We imaged coplanar poled electro optic (EO) polymer films on transparent substrates with a multiple-photon microscope in reflection and correlated the second-harmonic light intensity with the results of Pockels coefficient (r 33) measurements. This allowed us to make quantitative measurements of poled polymer films on non-transparent substrates like silicon, which are not accessible with traditional Pockels coefficient measurement techniques. Phase modulators consisting of silicon waveguide devices with EO polymer claddings with a known Pockels coefficient (from Vπ measurements) were used to validate the correlation between the second-harmonic signal and r 33. This also allowed us to locally map the r33 coefficient in the poled area.

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Characterization of coplanar poled electro optic polymer films for Si-photonic devices with multiphoton microscopy

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