@inproceedings{00b72463d5b44e18afce30b1cfa75548,
title = "Characteristics of the depth of focus in a high-NA optical system with a SIAX for data storage",
abstract = "We study the tolerance characteristic of SIAX and suggest a newly designed SIL-Axicon system for the better tolerances. Methods for checking beam quality, optimization and remaining problems are suggested. SIL-Axicon system shows more tolerances in the uniformity of beam incident angle. Bessel beam (BB) with SIL can be used for multi layer high density data storage systems. We study the tolerance characteristic of SIAX and suggest a newly designed SIL-Axicon system for the better tolerances.",
keywords = "Bessel beam, SIAX, SIL-Axicon, optical data storage",
author = "Jaisoon Kim and Moonseok Kim and Sukjoon Hong and Milster, {Tom D.}",
year = "2010",
doi = "10.1117/12.859234",
language = "English (US)",
isbn = "9780819482198",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Optical Data Storage 2010",
note = "Optical Data Storage 2010 ; Conference date: 23-05-2010 Through 26-05-2010",
}