@inproceedings{797ea599f9ff4776ac3e965ce89edb06,
title = "Challenges in polarization ray tracing",
abstract = "New polarization methods allow the ray tracing simulation of polarization critical components, including multilayer biaxial films, anisotropic and gyrotropic crystals, electro-optical, and magneto-optical materials bring many new challenges.",
keywords = "Polarization ray tracing, biaxial materials, birefringent material",
author = "Chipman, {Russell A.}",
year = "2010",
doi = "10.1117/12.868939",
language = "English (US)",
isbn = "9780819480828",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "International Optical Design Conference 2010",
note = "International Optical Design Conference 2010 ; Conference date: 13-06-2010 Through 17-06-2010",
}