TY - GEN
T1 - Challenges in polarization ray tracing
AU - Chipman, Russell A.
PY - 2010
Y1 - 2010
N2 - New polarization methods allow the ray tracing simulation of polarization critical components, including multilayer biaxial films, anisotropic and gyrotropic crystals, electro-optical, magneto-optical, and stressoptical modulators, photonic crystals and meta-materials.
AB - New polarization methods allow the ray tracing simulation of polarization critical components, including multilayer biaxial films, anisotropic and gyrotropic crystals, electro-optical, magneto-optical, and stressoptical modulators, photonic crystals and meta-materials.
UR - http://www.scopus.com/inward/record.url?scp=84896792894&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84896792894&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:84896792894
SN - 9781557528933
T3 - Optics InfoBase Conference Papers
BT - International Optical Design Conference, IODC 2010
T2 - International Optical Design Conference, IODC 2010
Y2 - 13 June 2010 through 17 June 2010
ER -