CCD soft-x-ray detectors with improved high- And low-energy performance

B. E. Burke; J. A. Gregory; A. H. Loomis; M. Lesser; M. W. Bautz; S. E. Kissel; D. D. Rathman; R. M. Osgood; M. J. Cooper

doi:10.1109/nssmic.2003.1352062

CCD soft-x-ray detectors with improved high- And low-energy performance

B. E. Burke, J. A. Gregory, A. H. Loomis, M. Lesser, M. W. Bautz, S. E. Kissel, D. D. Rathman, R. M. Osgood, M. J. Cooper

Research output: Contribution to journal › Conference article › peer-review

Abstract

We describe results from recent efforts to enhance the performance of CCDs to both low- and high-energy soft x rays. For improved low-energy (E<500 eV) sensitivity we show that a low-temperature surface treatment on back-illuminated devices results in generally better performance than that achieved on devices flown on Chandra, which had a more process-intensive high-temperature treatment. For improved high-energy response we describe a design approach for MOS CCDs that allows high substrate biases for deep depletion (>160 μm) and thus improved x-ray detection for E>5 keV.

Original language	English (US)
Article number	N16-7
Pages (from-to)	355-359
Number of pages	5
Journal	IEEE Nuclear Science Symposium Conference Record
Volume	1
DOIs	https://doi.org/10.1109/nssmic.2003.1352062
State	Published - 2003
Event	2003 IEEE Nuclear Science Symposium Conference Record - Nuclear Science Symposium, Medical Imaging Conference - Portland, OR, United States Duration: Oct 19 2003 → Oct 25 2003

ASJC Scopus subject areas

Radiation
Nuclear and High Energy Physics
Radiology Nuclear Medicine and imaging

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10.1109/nssmic.2003.1352062

Cite this

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title = "CCD soft-x-ray detectors with improved high- And low-energy performance",

abstract = "We describe results from recent efforts to enhance the performance of CCDs to both low- and high-energy soft x rays. For improved low-energy (E<500 eV) sensitivity we show that a low-temperature surface treatment on back-illuminated devices results in generally better performance than that achieved on devices flown on Chandra, which had a more process-intensive high-temperature treatment. For improved high-energy response we describe a design approach for MOS CCDs that allows high substrate biases for deep depletion (>160 μm) and thus improved x-ray detection for E>5 keV.",

author = "Burke, {B. E.} and Gregory, {J. A.} and Loomis, {A. H.} and M. Lesser and Bautz, {M. W.} and Kissel, {S. E.} and Rathman, {D. D.} and Osgood, {R. M.} and Cooper, {M. J.}",

year = "2003",

doi = "10.1109/nssmic.2003.1352062",

language = "English (US)",

volume = "1",

pages = "355--359",

journal = "IEEE Nuclear Science Symposium Conference Record",

issn = "1095-7863",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "2003 IEEE Nuclear Science Symposium Conference Record - Nuclear Science Symposium, Medical Imaging Conference ; Conference date: 19-10-2003 Through 25-10-2003",

}

TY - JOUR

T1 - CCD soft-x-ray detectors with improved high- And low-energy performance

AU - Burke, B. E.

AU - Gregory, J. A.

AU - Loomis, A. H.

AU - Lesser, M.

AU - Bautz, M. W.

AU - Kissel, S. E.

AU - Rathman, D. D.

AU - Osgood, R. M.

AU - Cooper, M. J.

PY - 2003

Y1 - 2003

N2 - We describe results from recent efforts to enhance the performance of CCDs to both low- and high-energy soft x rays. For improved low-energy (E<500 eV) sensitivity we show that a low-temperature surface treatment on back-illuminated devices results in generally better performance than that achieved on devices flown on Chandra, which had a more process-intensive high-temperature treatment. For improved high-energy response we describe a design approach for MOS CCDs that allows high substrate biases for deep depletion (>160 μm) and thus improved x-ray detection for E>5 keV.

AB - We describe results from recent efforts to enhance the performance of CCDs to both low- and high-energy soft x rays. For improved low-energy (E<500 eV) sensitivity we show that a low-temperature surface treatment on back-illuminated devices results in generally better performance than that achieved on devices flown on Chandra, which had a more process-intensive high-temperature treatment. For improved high-energy response we describe a design approach for MOS CCDs that allows high substrate biases for deep depletion (>160 μm) and thus improved x-ray detection for E>5 keV.

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U2 - 10.1109/nssmic.2003.1352062

DO - 10.1109/nssmic.2003.1352062

M3 - Conference article

AN - SCOPUS:11844255502

SN - 1095-7863

VL - 1

SP - 355

EP - 359

JO - IEEE Nuclear Science Symposium Conference Record

JF - IEEE Nuclear Science Symposium Conference Record

M1 - N16-7

T2 - 2003 IEEE Nuclear Science Symposium Conference Record - Nuclear Science Symposium, Medical Imaging Conference

Y2 - 19 October 2003 through 25 October 2003

ER -

CCD soft-x-ray detectors with improved high- And low-energy performance

Abstract

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