Abstract
The reflection properties of opaque fluorescent materials are measured with a 450/00 (illumination-viewing) spectroradiometer system interfaced to a desktop calculator. These measured values are then used to determine the samples’ chromaticity coordinates and the fluorescent contribution to the radiance factor. To obtain these parameters, the calculator is used to optimize the design of an illuminant D-65 simulator; accept data for instrument calibration and reflectance measurements; calculate the sample’s chromaticity coordinates; and graphically display the sample’s non-fluorescent and total radiance factors. The performance requirements and chromaticity coordinates of a sample are displayed on a computer prepared plot to aid in evaluating a material’s conformance to desired specifications.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 48-55 |
| Number of pages | 8 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 230 |
| DOIs | |
| State | Published - Aug 8 1980 |
| Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering