Broadband on-wafer calibrations comparison for accuracy and repeatability on co-planar waveguide structures

Qian Li; Kathleen L. Melde

doi:10.1109/EPEP.2007.4387190

Broadband on-wafer calibrations comparison for accuracy and repeatability on co-planar waveguide structures

Qian Li, Kathleen L. Melde

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

4 Scopus citations

Abstract

This paper compares four popular on-wafer calibration methods including Multiline TRL, LRRM, LRM, and SOLT, based on three diverse coplanar waveguide circuits. The results show that the Multiline TRL provides the highest accuracy and repeatability for all of the circuits up to 40GHz.

Original language	English (US)
Title of host publication	IEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP
Pages	315-318
Number of pages	4
DOIs	https://doi.org/10.1109/EPEP.2007.4387190
State	Published - 2007
Event	IEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP - Atlanta, GA, United States Duration: Oct 29 2007 → Oct 31 2007

Publication series

Name	IEEE Topical Meeting on Electrical Performance of Electronic Packaging

Other

Other	IEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP
Country/Territory	United States
City	Atlanta, GA
Period	10/29/07 → 10/31/07

ASJC Scopus subject areas

General Engineering

Access to Document

10.1109/EPEP.2007.4387190

Cite this

Li, Q., & Melde, K. L. (2007). Broadband on-wafer calibrations comparison for accuracy and repeatability on co-planar waveguide structures. In IEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP (pp. 315-318). Article 4387190 (IEEE Topical Meeting on Electrical Performance of Electronic Packaging). https://doi.org/10.1109/EPEP.2007.4387190

Broadband on-wafer calibrations comparison for accuracy and repeatability on co-planar waveguide structures. / Li, Qian; Melde, Kathleen L.
IEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP. 2007. p. 315-318 4387190 (IEEE Topical Meeting on Electrical Performance of Electronic Packaging).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Li, Q & Melde, KL 2007, Broadband on-wafer calibrations comparison for accuracy and repeatability on co-planar waveguide structures. in IEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP., 4387190, IEEE Topical Meeting on Electrical Performance of Electronic Packaging, pp. 315-318, IEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP, Atlanta, GA, United States, 10/29/07. https://doi.org/10.1109/EPEP.2007.4387190

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abstract = "This paper compares four popular on-wafer calibration methods including Multiline TRL, LRRM, LRM, and SOLT, based on three diverse coplanar waveguide circuits. The results show that the Multiline TRL provides the highest accuracy and repeatability for all of the circuits up to 40GHz.",

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Broadband on-wafer calibrations comparison for accuracy and repeatability on co-planar waveguide structures

Abstract

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ASJC Scopus subject areas

Access to Document

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