Abstract
This paper describes the extraction of the dielectric properties of a nanostructured thin film from two-port S-parameter measurements on coplanar waveguide (CPW) lines. The CPW line is on top of a bilayer structure formed by a supporting glass substrate and a dielectric thin film made by dispersing silver nanoparticles inside a polymer host. A dispersion mechanism due to internal inductance of the CPW line when calculating the effective dielectric constant is investigated. The extraction involves conformal-mapping approximation that uses closed-form equations to calculate the dielectric constant and the loss tangent of each layer based on the effective dielectric constant and loss tangent of the entire structure. Additionally, computer-aided-design model with a direct fitting technique are deployed for further investigation of potential multimode propagation for a CPW line with a substrate that has a very large dielectric constant. The results of the two techniques are compared and discussed. The measured dielectric constant ranges from 3 × 104 to 4.6 × 103 from 1 to 20 GHz with a loss tangent of 0.55 to 1.75 from 1 to 20 GHz.
Original language | English (US) |
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Article number | 7272136 |
Pages (from-to) | 3768-3774 |
Number of pages | 7 |
Journal | IEEE Transactions on Microwave Theory and Techniques |
Volume | 63 |
Issue number | 11 |
DOIs | |
State | Published - Nov 1 2015 |
Keywords
- Giant dielectric
- Thin film
- nanostructured material
ASJC Scopus subject areas
- Radiation
- Condensed Matter Physics
- Electrical and Electronic Engineering