Broadband Microwave Characterization of Nanostructured Thin Film with Giant Dielectric Response

Te Chuan Chen, Lu Wang, Gordon Goodyear, Angelo Yializis, Hao Xin

Research output: Contribution to journalArticlepeer-review

3 Scopus citations


This paper describes the extraction of the dielectric properties of a nanostructured thin film from two-port S-parameter measurements on coplanar waveguide (CPW) lines. The CPW line is on top of a bilayer structure formed by a supporting glass substrate and a dielectric thin film made by dispersing silver nanoparticles inside a polymer host. A dispersion mechanism due to internal inductance of the CPW line when calculating the effective dielectric constant is investigated. The extraction involves conformal-mapping approximation that uses closed-form equations to calculate the dielectric constant and the loss tangent of each layer based on the effective dielectric constant and loss tangent of the entire structure. Additionally, computer-aided-design model with a direct fitting technique are deployed for further investigation of potential multimode propagation for a CPW line with a substrate that has a very large dielectric constant. The results of the two techniques are compared and discussed. The measured dielectric constant ranges from 3 × 104 to 4.6 × 103 from 1 to 20 GHz with a loss tangent of 0.55 to 1.75 from 1 to 20 GHz.

Original languageEnglish (US)
Article number7272136
Pages (from-to)3768-3774
Number of pages7
JournalIEEE Transactions on Microwave Theory and Techniques
Issue number11
StatePublished - Nov 1 2015


  • Giant dielectric
  • Thin film
  • nanostructured material

ASJC Scopus subject areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering


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