Abstract
A simple frequency-dependent ellipsometric technique for measuring the birefringence, the Pockels and Kerr properties of low glass-transition temperature photorefractive polymers is proposed. The technique is applied to the characterization of highly efficient DMNPAA:PVK:ECZ:TNF photorefractive polymers and the determination of the microscopic properties of the DMNPAA molecule.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1748-1750 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 68 |
| Issue number | 13 |
| DOIs | |
| State | Published - 1996 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)
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