Abstract
A new binary classification method for Mueller matrix images is presented which optimizes the polarization state analyzer (PSA) and the polarization state generator (PSG) using a statistical divergence between pixel values in two regions of an image. This optimization generalizes to multiple PSA/PSG pairs so that the classification performance as a function of number of polarimetric measurements can be considered. Optimizing PSA/PSG pairs gives insight into which polarimetric measurements are most useful for the binary classification. For example, in scenes with strong diattenuation, retardance, or depolarization certain PSA/PSG pairs would make two regions in an image look very similar and other pairs would make the regions look very different. The method presented in this paper provides a quantitative method for ensuring the images acquired can be classified optimally.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 983-990 |
| Number of pages | 8 |
| Journal | Journal of the Optical Society of America A: Optics and Image Science, and Vision |
| Volume | 34 |
| Issue number | 6 |
| DOIs | |
| State | Published - Jun 1 2017 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Computer Vision and Pattern Recognition