Abstract
Biaxial ellipsometry measures the optical constants of materials, anisotropic films, and stacks of anistropic films. Materials of interest include birefringent crystals, polarizing materials and films, and the complex multilayer anisotropic structures used in liquid crystal displays. An approach using Mueller matrix imaging polarimetry to simultaneously measure and angularly resolve reflection and transmission over large solid angles is presented. Biaxial materials have three refractive indices and three absorption coefficients in orthogonal directions but with arbitrary orientation. Determination of the dielectric tensor provides a succinct and suitable material representation, and its accurate determination is the focus of this investigation.
| Original language | English (US) |
|---|---|
| Article number | 587506 |
| Pages (from-to) | 1-8 |
| Number of pages | 8 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 5875 |
| DOIs | |
| State | Published - 2005 |
| Event | Novel Optical Systems Design and Optimization VIII - San Diego, CA, United States Duration: Jul 31 2005 → Aug 1 2005 |
Keywords
- Biaxial
- Birefringent
- Dichroism
- Dielectric tensor
- Ellipsometry
- Polarimetry
- Retardance
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering