Beyond MRT

Ellis E. Burroughs, Ronald G. Driggers, Carl E. Halford, Mark A. Manzardo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations


Present laboratory test techniques for evaluating Forward Looking Infrared (FLIR) target acquisition sensors largely rely on simplistic infrared scenes such as four-bar targets against highly uniform backgrounds. One such test, Minimum Resolvable Temperature (MRT), is the primary laboratory test and evaluation (T&E) parameter for FLIRs. While these `simple' targets remove many `unwanted' variables for engineering analysis, they do not resemble the `real world'. Tactical FLIR sensors are being integrated into target acquisition subsystems (TAS) to provide information for purpose other than visual consumption, including automatic target detection, queuing, tracking, and automatic target recognizers. Ultimately, FLIR TAS operational performance must be demonstrated through live field testing. However, new acquisition strategies are driving toward performance specifications and increased modeling and simulation (and realism) into all levels of the testing processes. The time has come to look beyond MRT to assess the total operational performance of FLIR target acquisition subsystems in the laboratory. This paper describes the application of Dynamic Infrared Scene Projection (DIRSP) to project synthetic in- band infrared imagery (surrogate of the real-world) into the FLIR sensor entrance aperture. This paper concludes with a proposed utilization of DIRSP to support laboratory T&E of tactical FLIR target acquisition subsystems - beyond MRT.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsGerald C. Holst
PublisherSociety of Photo-Optical Instrumentation Engineers
Number of pages9
ISBN (Print)0819424781
StatePublished - 1997
Externally publishedYes
EventInfrared Imaging Systems: Design, Analysis, Modeling, and Testing VIII - Orlando, FL, USA
Duration: Apr 23 1997Apr 24 1997

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X


ConferenceInfrared Imaging Systems: Design, Analysis, Modeling, and Testing VIII
CityOrlando, FL, USA

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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