Bayesian reliability modeling of multi-level system with interdependent subsystems and components

Jian Liu, Jing Li, Byoung Uk Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

Modeling the reliability of multi-level engineering systems is critically important yet technically challenging. Existing methods have limited consideration of the failure interdependency caused by the interactions among subsystems and components. In this paper, a new Bayesian Network (BN) representation of system structure and component interactions is proposed. Based on the BN representation, a Bayesian framework is developed to fuse the information from different levels of a system for modeling the reliability of the components, subsystems and the system as a whole. A case study is conducted to demonstrate the effectiveness of the proposed methodology.

Original languageEnglish (US)
Title of host publicationProceedings of 2011 IEEE International Conference on Intelligence and Security Informatics, ISI 2011
Pages252-257
Number of pages6
DOIs
StatePublished - 2011
Event2011 IEEE International Conference on Intelligence and Security Informatics, ISI 2011 - Beijing, China
Duration: Jul 10 2011Jul 12 2011

Publication series

NameProceedings of 2011 IEEE International Conference on Intelligence and Security Informatics, ISI 2011

Other

Other2011 IEEE International Conference on Intelligence and Security Informatics, ISI 2011
Country/TerritoryChina
CityBeijing
Period7/10/117/12/11

Keywords

  • Bayesian Network
  • Binomial test data
  • failure interdependency
  • information fusion

ASJC Scopus subject areas

  • Artificial Intelligence
  • Information Systems

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