TY - GEN
T1 - Bayesian Accelerated Reliability Growth of Complex Systems
AU - Ruiz, Cesar
AU - Liao, Haitao
AU - Pohl, Ed
AU - Sullivan, Kelly M.
N1 - Funding Information:
This research was supported by the Office of the Secretary of Defense, Directorate of Operational Test and Evaluation (OSD DOT&E) and the Test Resource Management Center (TRMC) under the Science of Test research program. Special thanks to both Dr. Catherine Warner, OSD DOT&E, and Mr. George Rumford, TRMC, for sponsoring the research program.
Publisher Copyright:
© 2018 IEEE.
PY - 2018/9/11
Y1 - 2018/9/11
N2 - Today's competitive global business environment and continually increasing product complexity have created a need to shorten product development time while guaranteeing high reliability for customers. In this context, reliability growth programs and accelerated life testing (ALT) have become the tools of choice to help companies achieve their product reliability goals as fast as possible. One of the most popular statistical models for analyzing reliability growth data is the Crow-AMSAA model, which struggles to incorporate ALT data when the product has multiple failure modes. Moreover, key system components may be developed independently and without incorporating the testing results in the product reliability estimation. Thus, companies may be performing unnecessary testing at the system level.
AB - Today's competitive global business environment and continually increasing product complexity have created a need to shorten product development time while guaranteeing high reliability for customers. In this context, reliability growth programs and accelerated life testing (ALT) have become the tools of choice to help companies achieve their product reliability goals as fast as possible. One of the most popular statistical models for analyzing reliability growth data is the Crow-AMSAA model, which struggles to incorporate ALT data when the product has multiple failure modes. Moreover, key system components may be developed independently and without incorporating the testing results in the product reliability estimation. Thus, companies may be performing unnecessary testing at the system level.
KW - Accelerated Life Testing
KW - Bayesian Statistics
KW - Reliability Growth
UR - http://www.scopus.com/inward/record.url?scp=85054139533&partnerID=8YFLogxK
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U2 - 10.1109/RAM.2018.8463111
DO - 10.1109/RAM.2018.8463111
M3 - Conference contribution
AN - SCOPUS:85054139533
SN - 9781538628706
T3 - Proceedings - Annual Reliability and Maintainability Symposium
BT - 2018 Annual Reliability and Maintainability Symposium, RAMS 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2018 Annual Reliability and Maintainability Symposium, RAMS 2018
Y2 - 22 January 2018 through 25 January 2018
ER -