Automating test generation for discrete event oriented embedded systems

Steven J. Cunning; Jerzy W. Rozenblit

doi:10.1007/s10846-005-3810-8

Automating test generation for discrete event oriented embedded systems

Steven J. Cunning, Jerzy W. Rozenblit

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

A method for the automatic generation of test scenarios from the behavioral requirements of a system is presented in this paper. The generated suite of test scenarios validates the system design or implementation against the requirements. The approach proposed here uses a requirements model and a set of four algorithms. The requirements model is an executable model of the proposed system defined in a deterministic state-based modeling formalism. Each action in the requirements model that changes the state of the model is identified with a unique requirement identifier. The scenario generation algorithms perform controlled simulations of the requirements model in order to generate a suite of test scenarios applicable for black box testing. Measurements of several metrics on the scenario generation algorithms have been collected using prototype tools.

Original language	English (US)
Pages (from-to)	87-112
Number of pages	26
Journal	Journal of Intelligent and Robotic Systems: Theory and Applications
Volume	41
Issue number	2-3
DOIs	https://doi.org/10.1007/s10846-005-3810-8
State	Published - Jan 2005

Keywords

Embedded systems
Requirements modeling
Test pattern generation

ASJC Scopus subject areas

Software
Control and Systems Engineering
Mechanical Engineering
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering
Artificial Intelligence

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10.1007/s10846-005-3810-8

Cite this

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title = "Automating test generation for discrete event oriented embedded systems",

abstract = "A method for the automatic generation of test scenarios from the behavioral requirements of a system is presented in this paper. The generated suite of test scenarios validates the system design or implementation against the requirements. The approach proposed here uses a requirements model and a set of four algorithms. The requirements model is an executable model of the proposed system defined in a deterministic state-based modeling formalism. Each action in the requirements model that changes the state of the model is identified with a unique requirement identifier. The scenario generation algorithms perform controlled simulations of the requirements model in order to generate a suite of test scenarios applicable for black box testing. Measurements of several metrics on the scenario generation algorithms have been collected using prototype tools.",

keywords = "Embedded systems, Requirements modeling, Test pattern generation",

author = "Cunning, {Steven J.} and Rozenblit, {Jerzy W.}",

note = "Funding Information: This work was supported by grant number 9554561 from the National Science Foundation. Our thanks goes to the members of the Naval Research Labs, Constance Heitmeyer, Bruce Labaw, Jim Kirby, Ralph Jeffords, and Todd Grimm, for providing their SCR Toolset. We also thank the University of Bremen for the use of the graph visualization tool, DaVinci, which was used to create the graphs in figures 3, 4, and 6.",

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KW - Embedded systems

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KW - Test pattern generation

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Automating test generation for discrete event oriented embedded systems

Abstract

Keywords

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