Automated MTF analyzer for spectacle lenses

Jonathan J. Drewes; Russell A. Chipman; James B. Hadaway; Anees Ahmad

doi:10.1117/12.295124

Automated MTF analyzer for spectacle lenses

Jonathan J. Drewes, Russell A. Chipman, James B. Hadaway, Anees Ahmad

Research output: Contribution to journal › Conference article › peer-review

3 Scopus citations

Abstract

An optical testing instrument, the Eyeglass Image Quality Mapper, has been developed that maps the power, astigmatism, and modulation transfer function over the surface of a progressive addition eyeglass lens. This instrument models the manner in which the eye views different regions of the lens and is automated so that testing can be performed without supervision and in a reasonable amount of time.In this paper, we describe the concept development, final design, and use of the instrument.

Original language	English (US)
Pages (from-to)	122-135
Number of pages	14
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	3134
DOIs	https://doi.org/10.1117/12.295124
State	Published - 1997
Externally published	Yes
Event	Optical Manufacturing and Testing II - San Diego, CA, United States Duration: Jul 27 1997 → Jul 27 1997

Keywords

Eyeglass lenses
MTF
Metrology
Progressive addition lens (PAL)

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.295124

Cite this

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title = "Automated MTF analyzer for spectacle lenses",

abstract = "An optical testing instrument, the Eyeglass Image Quality Mapper, has been developed that maps the power, astigmatism, and modulation transfer function over the surface of a progressive addition eyeglass lens. This instrument models the manner in which the eye views different regions of the lens and is automated so that testing can be performed without supervision and in a reasonable amount of time.In this paper, we describe the concept development, final design, and use of the instrument.",

keywords = "Eyeglass lenses, MTF, Metrology, Progressive addition lens (PAL)",

author = "Drewes, {Jonathan J.} and Chipman, {Russell A.} and Hadaway, {James B.} and Anees Ahmad",

year = "1997",

doi = "10.1117/12.295124",

language = "English (US)",

volume = "3134",

pages = "122--135",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Optical Manufacturing and Testing II ; Conference date: 27-07-1997 Through 27-07-1997",

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TY - JOUR

T1 - Automated MTF analyzer for spectacle lenses

AU - Drewes, Jonathan J.

AU - Chipman, Russell A.

AU - Hadaway, James B.

AU - Ahmad, Anees

PY - 1997

Y1 - 1997

N2 - An optical testing instrument, the Eyeglass Image Quality Mapper, has been developed that maps the power, astigmatism, and modulation transfer function over the surface of a progressive addition eyeglass lens. This instrument models the manner in which the eye views different regions of the lens and is automated so that testing can be performed without supervision and in a reasonable amount of time.In this paper, we describe the concept development, final design, and use of the instrument.

AB - An optical testing instrument, the Eyeglass Image Quality Mapper, has been developed that maps the power, astigmatism, and modulation transfer function over the surface of a progressive addition eyeglass lens. This instrument models the manner in which the eye views different regions of the lens and is automated so that testing can be performed without supervision and in a reasonable amount of time.In this paper, we describe the concept development, final design, and use of the instrument.

KW - Eyeglass lenses

KW - MTF

KW - Metrology

KW - Progressive addition lens (PAL)

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U2 - 10.1117/12.295124

DO - 10.1117/12.295124

M3 - Conference article

AN - SCOPUS:58749111854

SN - 0277-786X

VL - 3134

SP - 122

EP - 135

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Optical Manufacturing and Testing II

Y2 - 27 July 1997 through 27 July 1997

ER -

Automated MTF analyzer for spectacle lenses

Abstract

Keywords

ASJC Scopus subject areas

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