Atomic force microscope: A new tool for imaging crystal growth processes

P. E. Hillner, S. Manne, P. K. Hansma, A. J. Gratz

Research output: Contribution to journalArticlepeer-review

63 Scopus citations


We present real-time and in situ atomic force microscope (AFM) observations of solution growth on the cleavage plane of two minerals, calcite and fluorite. Different growth behaviours are exhibited: the calcite surface grows via a layer-spiral mechanism, while the fluorite surface grows via the formation of sharp asperities. The differences in behaviour of the two minerals may be linked to the lack of local charge neutrality on the fluorite surface. The growth mechanisms observed on calcite and fluorite provide insight into the expected behaviour of a wide range of salts important in nature and industry.

Original languageEnglish (US)
Pages (from-to)191-197
Number of pages7
JournalFaraday Discussions
StatePublished - 1993

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry


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