TY - GEN
T1 - Application of the conjugate gradient technique to stripline packaging problems
AU - Wang, Xing
AU - Zhu, Zhaohui
AU - Cao, Yi
AU - Dvorak, Steven L.
AU - Prince, John L.
PY - 2006
Y1 - 2006
N2 - In most applications the Method of Moments (MoM) generates full reaction matrices. However, in this paper, we demonstrate that sparse reaction matrices are produced when modeling stripline interconnects. This is demonstrated by investigating the sparse nature of the MoM reaction matrices that are produced when using the Full-Wave Layered Interconnect Simulator (UA-FWLIS) with a parallel-plate Green's function. In order to explain the sparse nature of the reaction matrices, the electric fields that are excited by horizontal and vertical electric dipole sources are briefly overviewed. Then the variations of the reaction elements with distance are studied, and this information is used to provide a cut-off criterion for the reaction element calculations. We found that by applying sparse matrix storage techniques and a sparse matrix solver, the matrix solution time is dramatically improved when compared with a commercial MoM-based simulator.
AB - In most applications the Method of Moments (MoM) generates full reaction matrices. However, in this paper, we demonstrate that sparse reaction matrices are produced when modeling stripline interconnects. This is demonstrated by investigating the sparse nature of the MoM reaction matrices that are produced when using the Full-Wave Layered Interconnect Simulator (UA-FWLIS) with a parallel-plate Green's function. In order to explain the sparse nature of the reaction matrices, the electric fields that are excited by horizontal and vertical electric dipole sources are briefly overviewed. Then the variations of the reaction elements with distance are studied, and this information is used to provide a cut-off criterion for the reaction element calculations. We found that by applying sparse matrix storage techniques and a sparse matrix solver, the matrix solution time is dramatically improved when compared with a commercial MoM-based simulator.
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U2 - 10.1109/SPI.2006.289174
DO - 10.1109/SPI.2006.289174
M3 - Conference contribution
AN - SCOPUS:44449141087
SN - 1424404541
SN - 9781424404544
T3 - Proceedings - 10th IEEE Workshop on Signal Propagation on Interconnects, SPI 2006
SP - 17
EP - 20
BT - Proceedings - 10th IEEE Workshop on Signal Propagation on Interconnects, SPI 2006
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 10th IEEE Workshop on Signal Propagation on Interconnects, SPI 2006
Y2 - 9 May 2006 through 12 May 2006
ER -