Apertureless Scanning Raman Microscopy

Yanming Zhao, Brendan Mc Carthy, Thomas D. Milster, Mark S. Anderson, Dror Sarid

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We have developed a novel experimental configuration for local chemical characterization by combining the analytical power of Raman spectroscopy with the nanometer resolution of the atomic force microscope (AFM). Preliminary results indicate that using the SERS effect yields a large local magnification of the Raman signal.

Original languageEnglish (US)
Title of host publicationFrontiers in Optics, FiO 2003
PublisherOptica Publishing Group (formerly OSA)
ISBN (Electronic)1557527598
StatePublished - 2003
EventFrontiers in Optics, FiO 2003 - Tucson, United States
Duration: Oct 5 2003 → …

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceFrontiers in Optics, FiO 2003
Country/TerritoryUnited States
CityTucson
Period10/5/03 → …

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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