TY - GEN
T1 - Anomaly detection and target prioritization in planetary imagery via the automated global feature analyzer (AGFA)
T2 - 2018 Micro- and Nanotechnology (MNT) Sensors, Systems, and Applications X Conference
AU - Fink, Wolfgang
AU - Brooks, Alexander J.W.
AU - Tarbell, Mark A.
N1 - Funding Information:
The work described in this publication was carried out in part at the California Institute of Technology (2003 – 2016) and at the University of Arizona (2009 – present) with partial support from the Edward & Maria Keonjian Endowment at the University of Arizona. Author AJ-WB has been supported by NASA traineeship grant NNX15AJ17H via Arizona Space Grant Consortium (AZSGC).
Publisher Copyright:
© COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.
PY - 2018
Y1 - 2018
N2 - The Automated Global Feature AnalyzerTM (AGFATM) is a generically applicable automated sensor-data-fusion, feature extraction, feature vector clustering, anomaly detection, and target prioritization framework. AGFATM operates in the respective feature space delivered by the sensor(s). In this paper we provide an overview of the inner workings of AGFATMand apply AGFATM to planetary imagery, representative of past, current, and future planetary missions, to demonstrate its automated and objective (i.e., unbiased) anomaly detection and target prioritization (i.e., region-of-interest delineation) capabilities. Imaged operational areas are locally processed via a cascade of image segmentation, visual and geometric feature extraction, agglomerative clustering, and principal components analysis. Resulting clusters are labeled based on relative size and location in feature space. Anomalous regions may be considered immediate targets for follow-up in-situ investigation by local robotic agents, which can be directed via autonomous telecommanding, e.g., as part of a Tier-Scalable Reconnaissance mission architecture. These capabilities will be essential for driving fully autonomous C4ISR missions of the future, since the speed of light prohibits "real time" Earth-controlled conduct of planetary exploration beyond the Moon.
AB - The Automated Global Feature AnalyzerTM (AGFATM) is a generically applicable automated sensor-data-fusion, feature extraction, feature vector clustering, anomaly detection, and target prioritization framework. AGFATM operates in the respective feature space delivered by the sensor(s). In this paper we provide an overview of the inner workings of AGFATMand apply AGFATM to planetary imagery, representative of past, current, and future planetary missions, to demonstrate its automated and objective (i.e., unbiased) anomaly detection and target prioritization (i.e., region-of-interest delineation) capabilities. Imaged operational areas are locally processed via a cascade of image segmentation, visual and geometric feature extraction, agglomerative clustering, and principal components analysis. Resulting clusters are labeled based on relative size and location in feature space. Anomalous regions may be considered immediate targets for follow-up in-situ investigation by local robotic agents, which can be directed via autonomous telecommanding, e.g., as part of a Tier-Scalable Reconnaissance mission architecture. These capabilities will be essential for driving fully autonomous C4ISR missions of the future, since the speed of light prohibits "real time" Earth-controlled conduct of planetary exploration beyond the Moon.
KW - Agglomerative clustering
KW - Autonomous CISR systems
KW - Autonomous decision making
KW - Multi-Tiered robotic exploration architectures
KW - Objective anomaly detection
KW - Principal components analysis
KW - Sensor-data-fusion framework
KW - Target prioritization
UR - http://www.scopus.com/inward/record.url?scp=85049189340&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85049189340&partnerID=8YFLogxK
U2 - 10.1117/12.2303795
DO - 10.1117/12.2303795
M3 - Conference contribution
AN - SCOPUS:85049189340
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Micro- and Nanotechnology Sensors, Systems, and Applications X
A2 - Islam, M. Saif
A2 - George, Thomas
A2 - Dutta, Achyut K.
PB - SPIE
Y2 - 15 April 2018 through 19 April 2018
ER -