Analyzing Structural Dynamics in Nanocrystalline Thin Films using In-Situ 4D-STEM: A Statistical Approach

Yuan Tian; Yutong Bi; Mingjie Xu; Evgeniy Boltynjuk; Horst Hahn; Jian Han; David J. Srolovitz; Xiaoqing Pan

doi:10.1093/mam/ozae044.811

Analyzing Structural Dynamics in Nanocrystalline Thin Films using In-Situ 4D-STEM: A Statistical Approach

Yuan Tian
, Yutong Bi
, Mingjie Xu
, Evgeniy Boltynjuk
, Horst Hahn
, Jian Han
, David J. Srolovitz
, Xiaoqing Pan

Research output: Contribution to journal › Conference article › peer-review

Original language	English (US)
Pages (from-to)	1647-1648
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	30
Issue number	2024
DOIs	https://doi.org/10.1093/mam/ozae044.811
State	Published - Jul 24 2024
Externally published	Yes
Event	82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: Jul 28 2024 → Aug 1 2024

ASJC Scopus subject areas

Instrumentation

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10.1093/mam/ozae044.811

Cite this

@article{4c2c821593c844a48b3d4df25d0c766a,

title = "Analyzing Structural Dynamics in Nanocrystalline Thin Films using In-Situ 4D-STEM: A Statistical Approach",

author = "Yuan Tian and Yutong Bi and Mingjie Xu and Evgeniy Boltynjuk and Horst Hahn and Jian Han and Srolovitz, \{David J.\} and Xiaoqing Pan",

year = "2024",

month = jul,

day = "24",

doi = "10.1093/mam/ozae044.811",

language = "English (US)",

volume = "30",

pages = "1647--1648",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "2024",

note = "82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 ; Conference date: 28-07-2024 Through 01-08-2024",

}

TY - JOUR

T1 - Analyzing Structural Dynamics in Nanocrystalline Thin Films using In-Situ 4D-STEM

T2 - 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024

AU - Tian, Yuan

AU - Bi, Yutong

AU - Xu, Mingjie

AU - Boltynjuk, Evgeniy

AU - Hahn, Horst

AU - Han, Jian

AU - Srolovitz, David J.

AU - Pan, Xiaoqing

PY - 2024/7/24

Y1 - 2024/7/24

UR - https://www.scopus.com/pages/publications/85215678823

UR - https://www.scopus.com/pages/publications/85215678823#tab=citedBy

U2 - 10.1093/mam/ozae044.811

DO - 10.1093/mam/ozae044.811

M3 - Conference article

AN - SCOPUS:85215678823

SN - 1431-9276

VL - 30

SP - 1647

EP - 1648

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 2024

Y2 - 28 July 2024 through 1 August 2024

ER -

Analyzing Structural Dynamics in Nanocrystalline Thin Films using In-Situ 4D-STEM: A Statistical Approach

ASJC Scopus subject areas

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