Abstract
The objective of a number of optical instruments is to measure the intensity accurately without bias to incident polarization state. One method to overcome polarization bias in optical systems is the insertion of a spatial pseudodepolarizer. Both the degree of pseudodepolarization and image degradation (from the polarization aberrations of the pseudodepolarizer) are analyzed for two depolarizer designs: the Cornu pseudodepolarizer effective for linearly polarized light and the dual Babinet compensator pseudodepolarizer effective for all incident polarization states. The image analysis uses the matrix formalism presented in a previous paper (“Diffraction image formation and analysis in optical systems with polarization aberrations I: Formulation and example”) to describe the polarization dependence of the the diffraction patterns and optical transfer function.
Original language | English (US) |
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Pages (from-to) | 95-108 |
Number of pages | 14 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 1166 |
DOIs | |
State | Published - Jan 25 1990 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering