TY - JOUR
T1 - Analysis of multilayer thin-film structures containing magneto-optic and anisotropic media at oblique incidence using 2×2 matrices
AU - Mansuripur, M.
PY - 1990
Y1 - 1990
N2 - A complete analysis of multilayer structures containing an arbitrary number of dielectric, metal, magnetic, and birefringent/dichroic layers is presented. An algorithm, based on simple 2×2 matrices, is derived which allows reflection, transmission, absorption, magneto-optic conversion, birefringence, and dichroism of the structure to be computed on a personal computer. The incident beam is assumed to be plane monochromatic with arbitrary angle of incidence. There are no approximations involved, and the results are direct consequences of Maxwell's equations.
AB - A complete analysis of multilayer structures containing an arbitrary number of dielectric, metal, magnetic, and birefringent/dichroic layers is presented. An algorithm, based on simple 2×2 matrices, is derived which allows reflection, transmission, absorption, magneto-optic conversion, birefringence, and dichroism of the structure to be computed on a personal computer. The incident beam is assumed to be plane monochromatic with arbitrary angle of incidence. There are no approximations involved, and the results are direct consequences of Maxwell's equations.
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U2 - 10.1063/1.345121
DO - 10.1063/1.345121
M3 - Article
AN - SCOPUS:0000520740
SN - 0021-8979
VL - 67
SP - 6466
EP - 6475
JO - Journal of Applied Physics
JF - Journal of Applied Physics
IS - 10
ER -