An analysis on measurement sensitivity of short-pulse propagation technique using a virtual test bench

Zhen Zhou; Alina Deutsch; Kathleen L. Melde; George A. Katopis; Jason D. Morsey

doi:10.1109/EPEP.2008.4675917

An analysis on measurement sensitivity of short-pulse propagation technique using a virtual test bench

Zhen Zhou, Alina Deutsch, Kathleen L. Melde, George A. Katopis, Jason D. Morsey

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Scopus citations

Abstract

This paper presents the concept of using a virtual test bench to emulate measurements via simulation and modeling. For demonstration purposes, this idea is used to quantify the measurement sensitivity of the Short-Pulse Propagation technique to the line parameter tolerances found in production level circuit boards without building the hardware. This method is applicable to other measurement methodologies such as in the calibration and de embedding steps of frequency-domain characterization.

Original language	English (US)
Title of host publication	Electrical Performance of Electronic Packaging, EPEP 2008
Pages	213-216
Number of pages	4
DOIs	https://doi.org/10.1109/EPEP.2008.4675917
State	Published - 2008
Event	17th Conference on Electrical Performance of Electronic Packaging, EPEP 2008 - San Jose, CA, United States Duration: Oct 27 2008 → Oct 29 2008

Publication series

Name	Electrical Performance of Electronic Packaging, EPEP

Other

Other	17th Conference on Electrical Performance of Electronic Packaging, EPEP 2008
Country/Territory	United States
City	San Jose, CA
Period	10/27/08 → 10/29/08

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/EPEP.2008.4675917

Cite this

Zhou, Z., Deutsch, A., Melde, K. L., Katopis, G. A., & Morsey, J. D. (2008). An analysis on measurement sensitivity of short-pulse propagation technique using a virtual test bench. In Electrical Performance of Electronic Packaging, EPEP 2008 (pp. 213-216). Article 4675917 (Electrical Performance of Electronic Packaging, EPEP). https://doi.org/10.1109/EPEP.2008.4675917

An analysis on measurement sensitivity of short-pulse propagation technique using a virtual test bench. / Zhou, Zhen; Deutsch, Alina; Melde, Kathleen L. et al.
Electrical Performance of Electronic Packaging, EPEP 2008. 2008. p. 213-216 4675917 (Electrical Performance of Electronic Packaging, EPEP).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Zhou, Z, Deutsch, A, Melde, KL, Katopis, GA & Morsey, JD 2008, An analysis on measurement sensitivity of short-pulse propagation technique using a virtual test bench. in Electrical Performance of Electronic Packaging, EPEP 2008., 4675917, Electrical Performance of Electronic Packaging, EPEP, pp. 213-216, 17th Conference on Electrical Performance of Electronic Packaging, EPEP 2008, San Jose, CA, United States, 10/27/08. https://doi.org/10.1109/EPEP.2008.4675917

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An analysis on measurement sensitivity of short-pulse propagation technique using a virtual test bench

Abstract

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Other

ASJC Scopus subject areas

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