TY - GEN
T1 - An AFM study of chalcopyrite surface in aqueous solution
AU - Zhang, J.
AU - Zhang, W.
PY - 2010
Y1 - 2010
N2 - The surface of chalcopyrite was studied in situ in aqueous solution by an atomic force microscopy (AFM). The AFM images showed that some absorbate in patches was detected on the mineral surface, after the chalcopyrite sample was soaked in 5×10-4M potassium ethyl xanthate (KEX) solution at pH 11 for 10 minutes. These patches increased in size with time elapsing. At the same time, as shown by the obtained AFM force curves, the adhesion between the AFM tip and the substrate increased greatly due to the adsorption. Rinsing with ethanol removed the absorbate from the chalcopyrite surface, as well as the big adhesion observed in KEX solution.
AB - The surface of chalcopyrite was studied in situ in aqueous solution by an atomic force microscopy (AFM). The AFM images showed that some absorbate in patches was detected on the mineral surface, after the chalcopyrite sample was soaked in 5×10-4M potassium ethyl xanthate (KEX) solution at pH 11 for 10 minutes. These patches increased in size with time elapsing. At the same time, as shown by the obtained AFM force curves, the adhesion between the AFM tip and the substrate increased greatly due to the adsorption. Rinsing with ethanol removed the absorbate from the chalcopyrite surface, as well as the big adhesion observed in KEX solution.
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M3 - Conference contribution
AN - SCOPUS:77954234111
SN - 9781617380822
T3 - SME Annual Meeting and Exhibit 2010
SP - 535
EP - 539
BT - SME Annual Meeting and Exhibit 2010
T2 - SME Annual Meeting and Exhibit 2010
Y2 - 28 February 2010 through 3 March 2010
ER -