Amplitude edge response characterization of interferometer ITF and the effect of defocus

Daniel Millstone, Matthew Dubin, Erick Ruiz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations


As the industry standard for interferometer frequency response specifications, ITF has historically been calculated using expensive phase targets to capture interference-based phase information. Recent work in transfer function characterization of interferometers has produced a more accessible technique with the ability to predict a system's ITF utilizing a modified amplitude edge response. This technique does not require a phase measurement and demonstrates correlation between the ITF and an amplitude edge response for coherent systems, even in the presence of significant defocus. Defocused instruments exhibit modulation dropout in their transfer functions, now shown to be related to the Talbot Effect, exhibited here by imaging both phase and amplitude single frequency, square wave targets. This presentation outlines the modified amplitude edge response technique, utilization, and results for focused and defocused system characterization.

Original languageEnglish (US)
Title of host publicationInterferometry XX
EditorsMichael B. North Morris, Katherine Creath, Rosario Porras-Aguilar
ISBN (Electronic)9781510637863
StatePublished - 2020
EventInterferometry XX 2020 - Virtual, Online, United States
Duration: Aug 24 2020Sep 4 2020

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


ConferenceInterferometry XX 2020
Country/TerritoryUnited States
CityVirtual, Online


  • Defocus
  • Edge response
  • Frequency response
  • ITF
  • Interferometer
  • System characterization
  • Talbot effect
  • Transfer function

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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