Abstract
An infrared achromatic retarder was aligned and characterized using the University of Alabama in Huntsville's Fourier Transform Infrared (FTIR) Spectropolarimeter. The FTIR Spectropolarimeter produces a full polarization description of a sample over wavelengths 3-14μm. Mueller matrices were measured for different relative alignments between the complementary plates of the achromat until the retardance orientation variation was reduced to within ±1° and the retardance magnitude varied smoothly with a peak-to-valley difference of 24° from 4-14μm. The results presented here include the progression of retardance magnitudes and retardance orientations as the plate alignment varied as well as the final Mueller matrix and retardance components of the achromat element.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 28-34 |
| Number of pages | 7 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 3121 |
| DOIs | |
| State | Published - 1997 |
| Externally published | Yes |
| Event | Polarization: Measurement, Analysis, and Remote Sensing - San Diego, CA, United States Duration: Jul 30 1997 → Aug 1 1997 |
Keywords
- Achromatic retarder
- Mueller matrix
- Retardance vector
- Spectropolarimetry
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering