TY - GEN
T1 - Algorithms for the analysis of ultrathin samples with terahertz time domain spectroscopy
AU - Scheller, Maik
AU - Jansen, Christian
AU - Koch, Martin
PY - 2009
Y1 - 2009
N2 - We present a time domain and a frequency domain based algorithm for the analysis of spectroscopic terahertz data. The thickness information as well as the frequency dependent complex material parameters are extracted. Both methods can evaluate data obtained from measurements on sub-100μm thick samples, even in case of overlapping Fabry Perot echoes in the time domain. While the frequency domain approach provides highest accuracy, the time domain method is extremely computation efficient, enabling real time data extraction.
AB - We present a time domain and a frequency domain based algorithm for the analysis of spectroscopic terahertz data. The thickness information as well as the frequency dependent complex material parameters are extracted. Both methods can evaluate data obtained from measurements on sub-100μm thick samples, even in case of overlapping Fabry Perot echoes in the time domain. While the frequency domain approach provides highest accuracy, the time domain method is extremely computation efficient, enabling real time data extraction.
UR - http://www.scopus.com/inward/record.url?scp=72749097635&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=72749097635&partnerID=8YFLogxK
U2 - 10.1109/ICIMW.2009.5324656
DO - 10.1109/ICIMW.2009.5324656
M3 - Conference contribution
AN - SCOPUS:72749097635
SN - 9781424454174
T3 - 34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009
BT - 34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009
T2 - 34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009
Y2 - 21 September 2009 through 25 September 2009
ER -