Algorithms for the analysis of ultrathin samples with terahertz time domain spectroscopy

Maik Scheller, Christian Jansen, Martin Koch

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

We present a time domain and a frequency domain based algorithm for the analysis of spectroscopic terahertz data. The thickness information as well as the frequency dependent complex material parameters are extracted. Both methods can evaluate data obtained from measurements on sub-100μm thick samples, even in case of overlapping Fabry Perot echoes in the time domain. While the frequency domain approach provides highest accuracy, the time domain method is extremely computation efficient, enabling real time data extraction.

Original languageEnglish (US)
Title of host publication34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009
DOIs
StatePublished - 2009
Externally publishedYes
Event34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009 - Busan, Korea, Republic of
Duration: Sep 21 2009Sep 25 2009

Publication series

Name34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009

Other

Other34th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2009
Country/TerritoryKorea, Republic of
CityBusan
Period9/21/099/25/09

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Communication

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